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Title: X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry

Abstract

We report that Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 × 500 × 12.5 μm3 foils, 20 μm diameter wire, and >10 μm diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 μm copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 × 40 μm) and double (4 × 25 μm) copper x-pinches were driven at ~1 kA/ns. Lastly, moiré fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast.

Authors:
 [1];  [2];  [1];  [3];  [3];  [3];  [3];  [2];  [2];  [3];  [4];  [4];  [4];  [4];  [5];  [4];  [6]
+ Show Author Affiliations
  1. Johns Hopkins Univ., Baltimore, MD (United States)
  2. Pontificia Universidad Católica de Chile, Santiago (Chile)
  3. Univ. of Rochester, NY (United States)
  4. CNRS CEA, Ecole Polytechnique (France)
  5. Russian Academy of Sciences, Moscow (Russia)
  6. Université de Bordeaux-CNRS-CEA, CELIA, Talence (France)
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA)
OSTI Identifier:
1502138
Alternate Identifier(s):
OSTI ID: 1479133
Grant/Contract Number:  
NA0002955
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 89; Journal Issue: 10; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
70 PLASMA PHYSICS AND FUSION TECHNOLOGY

Citation Formats

Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Theobald, Wolfgang, Vescovi, Milenko, Useche, Wilmer, Regan, Sean P., Albertazzi, Bruno, Rigon, Gabriel, Mabey, Paul, Michel, Thibault, Pikuz, Sergey A., Koenig, Michel, and Casner, Alexis. X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry. United States: N. p., 2018. Web. doi:10.1063/1.5039342.
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Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Theobald, Wolfgang, Vescovi, Milenko, Useche, Wilmer, Regan, Sean P., Albertazzi, Bruno, Rigon, Gabriel, Mabey, Paul, Michel, Thibault, Pikuz, Sergey A., Koenig, Michel, & Casner, Alexis. X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry. United States. https://doi.org/10.1063/1.5039342
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Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Theobald, Wolfgang, Vescovi, Milenko, Useche, Wilmer, Regan, Sean P., Albertazzi, Bruno, Rigon, Gabriel, Mabey, Paul, Michel, Thibault, Pikuz, Sergey A., Koenig, Michel, and Casner, Alexis. Thu . "X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry". United States. https://doi.org/10.1063/1.5039342. https://www.osti.gov/servlets/purl/1502138.
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@article{osti_1502138,
title = {X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry},
author = {Valdivia, Maria Pia and Veloso, Felipe and Stutman, Dan and Stoeckl, Christian and Mileham, Chad and Begishev, Ildar A. and Theobald, Wolfgang and Vescovi, Milenko and Useche, Wilmer and Regan, Sean P. and Albertazzi, Bruno and Rigon, Gabriel and Mabey, Paul and Michel, Thibault and Pikuz, Sergey A. and Koenig, Michel and Casner, Alexis},
abstractNote = {We report that Talbot-Lau x-ray interferometers can map electron density gradients in High Energy Density (HED) samples. In the deflectometer configuration, it can provide refraction, attenuation, elemental composition, and scatter information from a single image. X-ray backlighters in Talbot-Lau deflectometry must meet specific requirements regarding source size and x-ray spectra, amongst others, to accurately diagnose a wide range of HED experiments. 8 keV sources produced in the high-power laser and pulsed power environment were evaluated as x-ray backlighters for Talbot-Lau x-ray deflectometry. In high-power laser experiments, K-shell emission was produced by irradiating copper targets (500 × 500 × 12.5 μm3 foils, 20 μm diameter wire, and >10 μm diameter spheres) with 30 J, 8-30 ps laser pulses and a 25 μm copper wire with a 60 J, 10 ps laser pulse. In the pulsed power environment, single (2 × 40 μm) and double (4 × 25 μm) copper x-pinches were driven at ~1 kA/ns. Lastly, moiré fringe formation was demonstrated for all x-ray sources explored, and detector performance was evaluated for x-ray films, x-ray CCDs, and imaging plates in context of spatial resolution, x-ray emission, and fringe contrast.},
doi = {10.1063/1.5039342},
journal = {Review of Scientific Instruments},
number = 10,
volume = 89,
place = {United States},
year = {Thu Oct 25 00:00:00 EDT 2018},
month = {Thu Oct 25 00:00:00 EDT 2018}
}
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Journal Article:
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Publisher's Version of Record
https://doi.org/10.1063/1.5039342
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Cited by: 12 works
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Figures / Tables:

FIG. 1 FIG. 1: Simulated contrast curves for the 8 keV Talbot-Lau interferometer studied. Talbot orders: m = 1, 3, 5, were obtained from XWFP code. Expected Cu emission lines are shown as well.
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Works referenced in this record:

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    Characterization of high spatial resolution lithium fluoride X-ray detectors
    journal, June 2019

    • Mabey, P.; Albertazzi, B.; Michel, Th.
    • Review of Scientific Instruments, Vol. 90, Issue 6
    • DOI: 10.1063/1.5092265
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