Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter
Abstract
A Talbot–Lau x-ray deflectometer can map electron density gradients in high energy density plasmas, as well as provide information about plasma elemental composition through single-image x-ray refraction and attenuation measurements. A new adaptation to a pulsed power environment used backlighting from copper X-pinches, allowing for electron density mapping of a low-Z object. Even though the X-pinch backlighter is not properly optimized for emitting x-rays in terms of source size and photon fluence, Moire fringe patterns with contrast up to 14% and fringe shift due to refraction on a beryllium object are obtained. Due to the proximity of the deflectometer with the X-pinch (~6 cm), it is shown that a protective filter is required to avoid damage in the closest (i.e., source) grating due to both plasma debris and mechanical shock. Regarding grating survival, these did not show any damage due to the intense magnetic field or heating induced by plasma radiation. Electron density on beryllium was measured with a difference lower than 16%. The areal electron density mapping of the sample was limited by source size characteristics, in similarity to transmission radiography. These results show the potential of plasma electron density as well as material mapping through Talbot–Lau x-ray deflectometrymore »
- Authors:
-
- Pontificia Universidad Católica de Chile, Santiago (Chile)
- Johns Hopkins Univ., Baltimore, MD (United States)
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); Comisión Nacional de Investigación Científica y Tecnológica (CONICYT); National Fund for Scientific and Technological Development (FONDECYT)
- OSTI Identifier:
- 1631998
- Alternate Identifier(s):
- OSTI ID: 1630457
- Grant/Contract Number:
- NA0003882; NA0002955
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 127; Journal Issue: 20; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; X-ray optics; X-ray diagnostics; Plasma production; High energy density physics; Time resolved imaging; Plasma diagnostics
Citation Formats
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, and Favre, Mario. Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter. United States: N. p., 2020.
Web. doi:10.1063/5.0001910.
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, & Favre, Mario. Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter. United States. https://doi.org/10.1063/5.0001910
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, and Favre, Mario. Fri .
"Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter". United States. https://doi.org/10.1063/5.0001910. https://www.osti.gov/servlets/purl/1631998.
@article{osti_1631998,
title = {Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter},
author = {Vescovi, Milenko and Valdivia, Maria Pia and Veloso, Felipe and Stutman, Dan and Favre, Mario},
abstractNote = {A Talbot–Lau x-ray deflectometer can map electron density gradients in high energy density plasmas, as well as provide information about plasma elemental composition through single-image x-ray refraction and attenuation measurements. A new adaptation to a pulsed power environment used backlighting from copper X-pinches, allowing for electron density mapping of a low-Z object. Even though the X-pinch backlighter is not properly optimized for emitting x-rays in terms of source size and photon fluence, Moire fringe patterns with contrast up to 14% and fringe shift due to refraction on a beryllium object are obtained. Due to the proximity of the deflectometer with the X-pinch (~6 cm), it is shown that a protective filter is required to avoid damage in the closest (i.e., source) grating due to both plasma debris and mechanical shock. Regarding grating survival, these did not show any damage due to the intense magnetic field or heating induced by plasma radiation. Electron density on beryllium was measured with a difference lower than 16%. The areal electron density mapping of the sample was limited by source size characteristics, in similarity to transmission radiography. These results show the potential of plasma electron density as well as material mapping through Talbot–Lau x-ray deflectometry in a pulsed power environment.},
doi = {10.1063/5.0001910},
journal = {Journal of Applied Physics},
number = 20,
volume = 127,
place = {United States},
year = {Fri May 29 00:00:00 EDT 2020},
month = {Fri May 29 00:00:00 EDT 2020}
}
Web of Science
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