Current advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited)
Abstract
Talbot–Lau x-ray interferometry is a refraction-based diagnostic that can map electron density gradients through phase-contrast methods. The Talbot–Lau x-ray deflectometry (TXD) diagnostics have been deployed in several high energy density experiments. To improve diagnostic performance, a monochromatic TXD was implemented on the Multi-Tera Watt (MTW) laser using 8 keV multilayer mirrors (Δθ/θ = 4.5%-5.6%). Copper foil and wire targets were irradiated at 1014–1015 W/cm2. Laser pulse length (~10 to 80 ps) and backlighter target configurations were explored in the context of Moiré fringe contrast and spatial resolution. Foil and wire targets delivered increased contrast <30%. The best spatial resolution (<6 μm) was measured for foils irradiated 80° from the surface. Further TXD diagnostic capability enhancement was achieved through the development of advanced data postprocessing tools. The Talbot Interferometry Analysis (TIA) code enabled x-ray refraction measurements from the MTW monochromatic TXD. Additionally, phase, attenuation, and dark-field maps of an ablating x-pinch load were retrieved through TXD. The images show a dense wire core of ~60 μm diameter surrounded by low-density material of ~40 μm thickness with an outer diameter ratio of ~2.3. Attenuation at 8 keV was measured at ~20% for the dense core and ~10% for the low-density material. Instrumentalmore »
- Authors:
-
- Univ. of California San Diego, La Jolla, CA (United States); Johns Hopkins Univ., Baltimore, MD (United States)
- Univ. de Valladolid (Spain)
- European XFEL GmbH, Schenefeld (Germany)
- General Atomics, San Diego, CA (United States)
- Univ. of Rochester, NY (United States)
- Univ. of Michigan, Ann Arbor, MI (United States)
- Johns Hopkins Univ., Laurel, MD (United States)
- Univ. of California San Diego, La Jolla, CA (United States)
- CEA-CESTA (France)
- ELI-NP, Inst. for Physics and Nuclear Engineering, Bucharest-Magurele (Romania)
- Publication Date:
- Research Org.:
- Univ. of California, San Diego, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1922232
- Alternate Identifier(s):
- OSTI ID: 1896321
- Grant/Contract Number:
- NA0004028; NA0003882; NA0003842; INTALAX
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 93; Journal Issue: 11; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; X-ray imaging; X-ray phase contrast imaging; High energy density physics; X-ray interferometry; Plasma properties and parameters
Citation Formats
Valdivia, M. P., Perez-Callejo, G., Bouffetier, V., Collins, IV, G. W., Stoeckl, C., Filkins, T., Mileham, C., Romanofsky, M., Begishev, I. A., Theobald, W., Klein, S. R., Schneider, M. K., Beg, F. N., Casner, A., and Stutman, D. Current advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited). United States: N. p., 2022.
Web. doi:10.1063/5.0101865.
Valdivia, M. P., Perez-Callejo, G., Bouffetier, V., Collins, IV, G. W., Stoeckl, C., Filkins, T., Mileham, C., Romanofsky, M., Begishev, I. A., Theobald, W., Klein, S. R., Schneider, M. K., Beg, F. N., Casner, A., & Stutman, D. Current advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited). United States. https://doi.org/10.1063/5.0101865
Valdivia, M. P., Perez-Callejo, G., Bouffetier, V., Collins, IV, G. W., Stoeckl, C., Filkins, T., Mileham, C., Romanofsky, M., Begishev, I. A., Theobald, W., Klein, S. R., Schneider, M. K., Beg, F. N., Casner, A., and Stutman, D. Tue .
"Current advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited)". United States. https://doi.org/10.1063/5.0101865. https://www.osti.gov/servlets/purl/1922232.
@article{osti_1922232,
title = {Current advances on Talbot–Lau x-ray imaging diagnostics for high energy density experiments (invited)},
author = {Valdivia, M. P. and Perez-Callejo, G. and Bouffetier, V. and Collins, IV, G. W. and Stoeckl, C. and Filkins, T. and Mileham, C. and Romanofsky, M. and Begishev, I. A. and Theobald, W. and Klein, S. R. and Schneider, M. K. and Beg, F. N. and Casner, A. and Stutman, D.},
abstractNote = {Talbot–Lau x-ray interferometry is a refraction-based diagnostic that can map electron density gradients through phase-contrast methods. The Talbot–Lau x-ray deflectometry (TXD) diagnostics have been deployed in several high energy density experiments. To improve diagnostic performance, a monochromatic TXD was implemented on the Multi-Tera Watt (MTW) laser using 8 keV multilayer mirrors (Δθ/θ = 4.5%-5.6%). Copper foil and wire targets were irradiated at 1014–1015 W/cm2. Laser pulse length (~10 to 80 ps) and backlighter target configurations were explored in the context of Moiré fringe contrast and spatial resolution. Foil and wire targets delivered increased contrast <30%. The best spatial resolution (<6 μm) was measured for foils irradiated 80° from the surface. Further TXD diagnostic capability enhancement was achieved through the development of advanced data postprocessing tools. The Talbot Interferometry Analysis (TIA) code enabled x-ray refraction measurements from the MTW monochromatic TXD. Additionally, phase, attenuation, and dark-field maps of an ablating x-pinch load were retrieved through TXD. The images show a dense wire core of ~60 μm diameter surrounded by low-density material of ~40 μm thickness with an outer diameter ratio of ~2.3. Attenuation at 8 keV was measured at ~20% for the dense core and ~10% for the low-density material. Instrumental and experimental limitations for monochromatic TXD diagnostics are presented. Enhanced postprocessing capabilities enabled by TIA are demonstrated in the context of high-intensity laser and pulsed power experimental data analysis. Significant advances in TXD diagnostic capabilities are presented. Furthermore, these results inform future diagnostic technique upgrades that will improve the accuracy of plasma characterization through TXD.},
doi = {10.1063/5.0101865},
journal = {Review of Scientific Instruments},
number = 11,
volume = 93,
place = {United States},
year = {Tue Nov 01 00:00:00 EDT 2022},
month = {Tue Nov 01 00:00:00 EDT 2022}
}
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