Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Valdivia, M. P.; Stutman, D.; Stoeckl, C.; Theobald, W.; Collins, G. W.; Bouffetier, V.; Vescovi, M.; Mileham, C.; Begishev, I. A.; Klein, S. R.; Melean, R.; Muller, S.; Zou, J.; Veloso, F.; Casner, A.; Beg, F. N.; Regan, S. P.

doi:10.1063/5.0043655

Title: Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Conference · Fri Jun 18 00:00:00 EDT 2021 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0043655· OSTI ID:1887901

^[1];

^[2]; Theobald, W. ^[2]; Collins, G. W. ^[3];

^[4]; Vescovi, M. ^[5]; Mileham, C. ^[2]; Begishev, I. A. ^[2];

^[6]; Melean, R. ^[6]; Muller, S. ^[7]; Zou, J. ^[2];

^[5];

^[8];

^[3]; Regan, S. P. ^[2]

Physics and Astronomy Department, Johns Hopkins University 1 , Baltimore, Maryland 21218, USA
Laboratory for Laser Energetics, University of Rochester 2 , Rochester, New York 14623, USA
Center for Energy Research, University of California San Diego 3 , San Diego, California 92093, USA
Université de Bordeaux-CNRS-CEA, Centre Lasers Intenses et Applications, UMR5107 4 , F-33405 Talence, France
Pontificia Universidad Catolica de Chile 5 , Casilla 306, Santiago, Chile
University of Michigan 6 , Ann Arbor, Michigan 48109, USA
General Atomics, Inertial Fusion Technology 7 , San Diego, California 92921, USA
CEA-CESTA 8 , 15 avenue des Sablières, CS 60001, 33116 Le Barp CEDEX, France

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm−3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

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Research Organization:: UCSD

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: NA0004028

OSTI ID:: 1887901

Journal Information:: Review of Scientific Instruments, Vol. 92, Issue 6; Conference: 23rd Topical Conference on High-Temperature Plasma Diagnostics, December 14-17, 2020; ISSN 0034-6748

Country of Publication:: United States

Language:: English

References (28)

Talbot-Lau x-ray interferometry for high energy density plasma diagnostic Stutman, D.; Finkenthal, M. Review of Scientific Instruments, Vol. 82, Issue 11 https://doi.org/10.1063/1.3660808	journal	November 2011
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for High Energy Density plasmas at energies below 10 keV Valdivia, M. P.; Stutman, D.; Finkenthal, M. Review of Scientific Instruments, Vol. 85, Issue 7 https://doi.org/10.1063/1.4885467	journal	July 2014
In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science Mayo, Sheridan C.; Stevenson, Andrew W.; Wilkins, Stephen W. Materials, Vol. 5, Issue 12 https://doi.org/10.3390/ma5050937	journal	May 2012
Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources Pfeiffer, Franz; Weitkamp, Timm; Bunk, Oliver Nature Physics, Vol. 2, Issue 4, p. 258-261 https://doi.org/10.1038/nphys265	journal	March 2006
Talbot-Lau based Moiré deflectometry with non-coherent sources as potential High Energy Density plasma diagnostic Valdivia, M. P.; Stutman, D.; Finkenthal, M. Journal of Applied Physics, Vol. 114, Issue 16 https://doi.org/10.1063/1.4827186	journal	October 2013
X-ray phase contrast imaging by compact Talbot–Lau interferometer with a single transmission grating Morimoto, Naoki; Fujino, Sho; Ohshima, Ken-ichi Optics Letters, Vol. 39, Issue 15 https://doi.org/10.1364/ol.39.004297	journal	January 2014
Partially coherent diffraction effect between Lau and Talbot effects Liu, Liren Journal of the Optical Society of America A, Vol. 5, Issue 10 https://doi.org/10.1364/josaa.5.001709	journal	January 1988
Realization of optical carpets in the Talbot and Talbot-Lau configurations Case, William B.; Tomandl, Mathias; Deachapunya, Sarayut Optics Express, Vol. 17, Issue 23 https://doi.org/10.1364/oe.17.020966	journal	January 2009
Development of optics for x-ray phase-contrast imaging of high energy density plasmas Stutman, D.; Finkenthal, M.; Moldovan, N. Review of Scientific Instruments, Vol. 81, Issue 10 https://doi.org/10.1063/1.3479116	journal	October 2010
Proof-of-concept Talbot–Lau x-ray interferometry with a high-intensity, high-repetition-rate, laser-driven K-alpha source Bouffetier, V.; Ceurvorst, L.; Valdivia, M. P. Applied Optics, Vol. 59, Issue 27 https://doi.org/10.1364/ao.398839	journal	January 2020
Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter Vescovi, Milenko; Valdivia, Maria Pia; Veloso, Felipe Journal of Applied Physics, Vol. 127, Issue 20 https://doi.org/10.1063/5.0001910	journal	May 2020
Inverse geometry for grating-based x-ray phase-contrast imaging Donath, Tilman; Chabior, Michael; Pfeiffer, Franz Journal of Applied Physics, Vol. 106, Issue 5, Article No. 054703 https://doi.org/10.1063/1.3208052	journal	September 2009
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 87, Issue 2 https://doi.org/10.1063/1.4941441	journal	February 2016
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry Valdivia, M. P.; Veloso, F.; Stutman, D. Review of Scientific Instruments, Vol. 89, Issue 10 https://doi.org/10.1063/1.5039342	journal	October 2018
Implementation of a Talbot–Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser Valdivia, M. P.; Stutman, D.; Stoeckl, C. Review of Scientific Instruments, Vol. 91, Issue 2 https://doi.org/10.1063/1.5123919	journal	February 2020
High-intensity laser-plasma interaction with wedge-shaped-cavity targets Theobald, W.; Ovchinnikov, V.; Ivancic, S. Physics of Plasmas, Vol. 17, Issue 10 https://doi.org/10.1063/1.3484217	journal	October 2010
Scaling Hot-Electron Generation to High-Power, Kilojoule-Class Laser-Solid Interactions Nilson, P. M.; Solodov, A. A.; Myatt, J. F. Physical Review Letters, Vol. 105, Issue 23 https://doi.org/10.1103/physrevlett.105.235001	journal	December 2010
Time-resolved K _α spectroscopy measurements of hot-electron equilibration dynamics in thin-foil solid targets: collisional and collective effects Nilson, P. M.; Solodov, A. A.; Davies, J. R. Journal of Physics B: Atomic, Molecular and Optical Physics, Vol. 48, Issue 22 https://doi.org/10.1088/0953-4075/48/22/224001	journal	September 2015
LLAMPÜDKEÑ: A high-current, low-impedance pulser employing an auxiliary exponential transmission line Chuaqui, H.; Wyndham, E.; Friedli, C. Laser and Particle Beams, Vol. 15, Issue 2 https://doi.org/10.1017/s0263034600010569	journal	June 1997
Absolute calibration of Kodak Biomax-MS film response to x rays in the 1.5- to 8-keV energy range Marshall, F. J.; Knauer, J. P.; Anderson, D. Review of Scientific Instruments, Vol. 77, Issue 10 https://doi.org/10.1063/1.2221698	journal	October 2006
Characterization and cross calibration of Agfa D4, D7, and D8 and Kodak SR45 x-ray films against direct exposure film at 4.0–5.5keV Lanier, N. E.; Cowan, J. S.; Workman, J. Review of Scientific Instruments, Vol. 77, Issue 4 https://doi.org/10.1063/1.2194509	journal	April 2006
Calibrating image plate sensitivity in the 700 to 5000 eV spectral energy range Haugh, Michael J.; Lee, Joshua; Romano, Edward SPIE Optical Engineering + Applications, SPIE Proceedings https://doi.org/10.1117/12.2024889	conference	September 2013
Absolute calibration of image plates for electrons at energy between 100keV and 4MeV Chen, Hui; Back, Norman L.; Bartal, Teresa Review of Scientific Instruments, Vol. 79, Issue 3 https://doi.org/10.1063/1.2885045	journal	March 2008
The x ‐pinch as a point source of x rays for backlighting Kalantar, D. H.; Hammer, D. A. Review of Scientific Instruments, Vol. 66, Issue 1 https://doi.org/10.1063/1.1146219	journal	January 1995
Hybrid X-pinch with conical electrodes Shelkovenko, T. A.; Pikuz, S. A.; Cahill, A. D. Physics of Plasmas, Vol. 17, Issue 11 https://doi.org/10.1063/1.3504226	journal	November 2010
Investigation into the dynamics of laser-cut foil X-pinches and their potential use for high repetition rate operation Collins, G. W.; Valdivia, M. P.; Zick, T. O. Applied Physics Letters, Vol. 105, Issue 2 https://doi.org/10.1063/1.4889748	journal	July 2014
Direct comparison of wire, foil, and hybrid X-pinches on a 200 kA, 150 ns current driver Collins, G. W.; Valdivia, M. P.; Hansen, S. B. Journal of Applied Physics, Vol. 129, Issue 7 https://doi.org/10.1063/5.0035587	journal	February 2021
XWFP: an x-ray wavefront propagation software package for the IDL computer language Weitkamp, Timm; Sanchez del Rio, Manuel https://doi.org/10.1117/12.569642	conference	October 2004

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