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Title: Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)

Abstract

Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25–29 J, 8–30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.

Authors:
 [1]; ; ; ; ; ;  [2];  [3]; ; ; ;  [4]
  1. Department of Physics and Astronomy, Johns Hopkins University, Baltimore, Maryland 21218 (United States)
  2. Laboratory for Laser Energetics, University of Rochester, Rochester, New York 14623 (United States)
  3. Center for Laser Experimental Astrophysical Research, University of Michigan, Ann Arbor, Michigan 48105 (United States)
  4. Instituto de Física, Pontificia Universidad Católica de Chile, Macul, Santiago (Chile)
Publication Date:
OSTI Identifier:
22596566
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 11; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ATTENUATION; COPPER; ELECTRON DENSITY; ELECTRONS; ENERGY DENSITY; FOILS; GRATINGS; IMAGES; INTERFEROMETERS; KEV RANGE 01-10; LASERS; PLASMA DENSITY; PULSES; REFRACTION; X RADIATION

Citation Formats

Valdivia, M. P., E-mail: mpvaldivia@pha.jhu.edu, Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Muñoz-Cordovez, G., Vescovi, M., Valenzuela-Villaseca, V., and Veloso, F. Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited). United States: N. p., 2016. Web. doi:10.1063/1.4959158.
Valdivia, M. P., E-mail: mpvaldivia@pha.jhu.edu, Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Muñoz-Cordovez, G., Vescovi, M., Valenzuela-Villaseca, V., & Veloso, F. Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited). United States. doi:10.1063/1.4959158.
Valdivia, M. P., E-mail: mpvaldivia@pha.jhu.edu, Stutman, D., Stoeckl, C., Mileham, C., Begishev, I. A., Theobald, W., Bromage, J., Regan, S. P., Klein, S. R., Muñoz-Cordovez, G., Vescovi, M., Valenzuela-Villaseca, V., and Veloso, F. Tue . "Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)". United States. doi:10.1063/1.4959158.
@article{osti_22596566,
title = {Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)},
author = {Valdivia, M. P., E-mail: mpvaldivia@pha.jhu.edu and Stutman, D. and Stoeckl, C. and Mileham, C. and Begishev, I. A. and Theobald, W. and Bromage, J. and Regan, S. P. and Klein, S. R. and Muñoz-Cordovez, G. and Vescovi, M. and Valenzuela-Villaseca, V. and Veloso, F.},
abstractNote = {Talbot-Lau X-ray deflectometry (TXD) has been developed as an electron density diagnostic for High Energy Density (HED) plasmas. The technique can deliver x-ray refraction, attenuation, elemental composition, and scatter information from a single Moiré image. An 8 keV Talbot-Lau interferometer was deployed using laser and x-pinch backlighters. Grating survival and electron density mapping were demonstrated for 25–29 J, 8–30 ps laser pulses using copper foil targets. Moiré pattern formation and grating survival were also observed using a copper x-pinch driven at 400 kA, ∼1 kA/ns. These results demonstrate the potential of TXD as an electron density diagnostic for HED plasmas.},
doi = {10.1063/1.4959158},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 11,
volume = 87,
place = {United States},
year = {2016},
month = {11}
}