Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic
- Physics and Astronomy Department, Johns Hopkins University 1 , Baltimore, Maryland 21218, USA
- Laboratory for Laser Energetics, University of Rochester 2 , Rochester, New York 14623, USA
- Center for Energy Research, University of California San Diego 3 , San Diego, California 92093, USA
- Université de Bordeaux-CNRS-CEA, Centre Lasers Intenses et Applications, UMR5107 4 , F-33405 Talence, France
- Pontificia Universidad Catolica de Chile 5 , Casilla 306, Santiago, Chile
- University of Michigan 6 , Ann Arbor, Michigan 48109, USA
- General Atomics, Inertial Fusion Technology 7 , San Diego, California 92921, USA
- CEA-CESTA 8 , 15 avenue des Sablières, CS 60001, 33116 Le Barp CEDEX, France
Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm−3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.
- Research Organization:
- UCSD
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- NA0004028
- OSTI ID:
- 1887901
- Journal Information:
- Review of Scientific Instruments, Vol. 92, Issue 6; Conference: 23rd Topical Conference on High-Temperature Plasma Diagnostics, December 14-17, 2020; ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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