Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Valdivia, M. P.; Stutman, D.; Stoeckl, C.; Theobald, W.; Collins, IV, G. W.; Bouffetier, V.; Vescovi, M.; Mileham, C.; Begishev, I. A.; Klein, S. R.; Melean, R.; Muller, S.; Zou, J.; Veloso, F.; Casner, A.; Beg, F. N.; Regan, S. P.

doi:10.1063/5.0043655

Title: Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Journal Article · Fri Jun 18 00:00:00 EDT 2021 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/5.0043655· OSTI ID:1837686

^[1];

^[2]; Theobald, W. ^[2]; Collins, IV, G. W. ^[3];

^[4]; Vescovi, M. ^[5]; Mileham, C. ^[2]; Begishev, I. A. ^[2];

^[6]; Melean, R. ^[6]; Muller, S. ^[7]; Zou, J. ^[2];

^[5];

^[8];

^[3]; Regan, S. P. ^[2]

Johns Hopkins Univ., Baltimore, MD (United States)
Univ. of Rochester, NY (United States)
Univ. of California San Diego, CA (United States)
Univ. de Bordeaux-CNRS-CEA, Talence (France)
Pontificia Univ. Catolica de Chile, Santiago (Chile)
Univ. of Michigan, Ann Arbor, MI (United States)
General Atomics, San Diego, CA (United States)
CEA-CESTA (France)

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (~350 kA, 350 ns and ~200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >10²³ cm^–3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. Furthermore, the results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

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Research Organization:: Johns Hopkins Univ., Baltimore, MD (United States); Univ. of California San Diego, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Fusion Energy Sciences (FES)

Grant/Contract Number:: NA0003882; NA0003842; NA0002955; SC0020005; 1171412; NA0004028

OSTI ID:: 1837686

Alternate ID(s):: OSTI ID: 1797613; OSTI ID: 1887291

Journal Information:: Review of Scientific Instruments, Vol. 92, Issue 6; ISSN 0034-6748

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Title: Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

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