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Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Conference · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/5.0043655· OSTI ID:1887901
 [1];  [2];  [3];  [3];  [4];  [5];  [6];  [3];  [3];  [7];  [7];  [8];  [3];  [6];  [9];  [4];  [3]
  1. Physics and Astronomy Department, Johns Hopkins University 1 , Baltimore, Maryland 21218, USA; UCSD
  2. Physics and Astronomy Department, Johns Hopkins University 1 , Baltimore, Maryland 21218, USA
  3. Laboratory for Laser Energetics, University of Rochester 2 , Rochester, New York 14623, USA
  4. Center for Energy Research, University of California San Diego 3 , San Diego, California 92093, USA
  5. Université de Bordeaux-CNRS-CEA, Centre Lasers Intenses et Applications, UMR5107 4 , F-33405 Talence, France
  6. Pontificia Universidad Catolica de Chile 5 , Casilla 306, Santiago, Chile
  7. University of Michigan 6 , Ann Arbor, Michigan 48109, USA
  8. General Atomics, Inertial Fusion Technology 7 , San Diego, California 92921, USA
  9. CEA-CESTA 8 , 15 avenue des Sablières, CS 60001, 33116 Le Barp CEDEX, France

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (∼350 kA, 350 ns and ∼200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm−3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. The results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

Research Organization:
UCSD
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0004028
OSTI ID:
1887901
Journal Information:
Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Journal Issue: 6 Vol. 92; ISSN 0034-6748
Country of Publication:
United States
Language:
English

References (31)

Hybrid X-pinch with conical electrodes journal November 2010
Proof-of-concept Talbot–Lau x-ray interferometry with a high-intensity, high-repetition-rate, laser-driven K-alpha source journal January 2020
The Lau effect (a diffraction experiment with incoherent illumination) journal March 1979
Implementation of a Talbot–Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser journal February 2020
XWFP: an x-ray wavefront propagation software package for the IDL computer language conference October 2004
Characterization and cross calibration of Agfa D4, D7, and D8 and Kodak SR45 x-ray films against direct exposure film at 4.0–5.5keV journal April 2006
Calibrating image plate sensitivity in the 700 to 5000 eV spectral energy range conference September 2013
250 kA compact linear transformer driver for wire array z -pinch loads journal May 2011
Direct comparison of wire, foil, and hybrid X-pinches on a 200 kA, 150 ns current driver journal February 2021
Investigation into the dynamics of laser-cut foil X-pinches and their potential use for high repetition rate operation journal July 2014
Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources journal March 2006
Development of optics for x-ray phase-contrast imaging of high energy density plasmas journal October 2010
In-Line Phase-Contrast X-ray Imaging and Tomography for Materials Science journal May 2012
Talbot-Lau x-ray interferometry for high energy density plasma diagnostic journal November 2011
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry journal October 2018
LLAMPÜDKEÑ: A high-current, low-impedance pulser employing an auxiliary exponential transmission line journal June 1997
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for High Energy Density plasmas at energies below 10 keV journal July 2014
Scaling Hot-Electron Generation to High-Power, Kilojoule-Class Laser-Solid Interactions journal December 2010
High-intensity laser-plasma interaction with wedge-shaped-cavity targets journal October 2010
Time-resolved K α spectroscopy measurements of hot-electron equilibration dynamics in thin-foil solid targets: collisional and collective effects journal September 2015
Absolute calibration of Kodak Biomax-MS film response to x rays in the 1.5- to 8-keV energy range journal October 2006
Talbot-Lau based Moiré deflectometry with non-coherent sources as potential High Energy Density plasma diagnostic journal October 2013
The x ‐pinch as a point source of x rays for backlighting journal January 1995
Realization of optical carpets in the Talbot and Talbot-Lau configurations journal January 2009
Partially coherent diffraction effect between Lau and Talbot effects journal January 1988
Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter journal May 2020
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics journal February 2016
X-ray phase contrast imaging by compact Talbot–Lau interferometer with a single transmission grating journal January 2014
Inverse geometry for grating-based x-ray phase-contrast imaging journal September 2009
Rayleigh-Taylor instability experiments on the LULI2000 laser in scaled conditions for young supernova remnants journal August 2019
Absolute calibration of image plates for electrons at energy between 100keV and 4MeV journal March 2008

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