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Title: Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic

Abstract

Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (~350 kA, 350 ns and ~200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm–3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. Furthermore, the results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.

Authors:
ORCiD logo [1]; ORCiD logo [1]; ORCiD logo [2];  [2];  [3]; ORCiD logo [4];  [5];  [2];  [2]; ORCiD logo [6];  [6];  [7];  [2]; ORCiD logo [5]; ORCiD logo [8]; ORCiD logo [3];  [2]
+ Show Author Affiliations
  1. Johns Hopkins Univ., Baltimore, MD (United States)
  2. Univ. of Rochester, NY (United States)
  3. Univ. of California San Diego, CA (United States)
  4. Univ. de Bordeaux-CNRS-CEA, Talence (France)
  5. Pontificia Univ. Catolica de Chile, Santiago (Chile)
  6. Univ. of Michigan, Ann Arbor, MI (United States)
  7. General Atomics, San Diego, CA (United States)
  8. CEA-CESTA (France)
Publication Date:
Research Org.:
Johns Hopkins Univ., Baltimore, MD (United States); Univ. of California San Diego, CA (United States)
Sponsoring Org.:
USDOE National Nuclear Security Administration (NNSA); USDOE Office of Science (SC), Fusion Energy Sciences (FES)
OSTI Identifier:
1837686
Alternate Identifier(s):
OSTI ID: 1797613; OSTI ID: 1887291
Grant/Contract Number:  
NA0003882; NA0003842; NA0002955; SC0020005; 1171412; NA0004028
Resource Type:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 92; Journal Issue: 6; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
47 OTHER INSTRUMENTATION; Interferometry; Laser plasma interactions; Plasma properties and parameters; Radiography; X-ray imaging; High energy density physics; X-ray imaging, Talbot-Lau, Interferometry, HED, Diagnostics

Citation Formats

Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Collins, IV, G. W., Bouffetier, V., Vescovi, M., Mileham, C., Begishev, I. A., Klein, S. R., Melean, R., Muller, S., Zou, J., Veloso, F., Casner, A., Beg, F. N., and Regan, S. P. Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic. United States: N. p., 2021. Web. doi:10.1063/5.0043655.
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Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Collins, IV, G. W., Bouffetier, V., Vescovi, M., Mileham, C., Begishev, I. A., Klein, S. R., Melean, R., Muller, S., Zou, J., Veloso, F., Casner, A., Beg, F. N., & Regan, S. P. Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic. United States. https://doi.org/10.1063/5.0043655
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Valdivia, M. P., Stutman, D., Stoeckl, C., Theobald, W., Collins, IV, G. W., Bouffetier, V., Vescovi, M., Mileham, C., Begishev, I. A., Klein, S. R., Melean, R., Muller, S., Zou, J., Veloso, F., Casner, A., Beg, F. N., and Regan, S. P. Fri . "Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic". United States. https://doi.org/10.1063/5.0043655. https://www.osti.gov/servlets/purl/1837686.
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@article{osti_1837686,
title = {Talbot-Lau x-ray deflectometer: Refraction-based HEDP imaging diagnostic},
author = {Valdivia, M. P. and Stutman, D. and Stoeckl, C. and Theobald, W. and Collins, IV, G. W. and Bouffetier, V. and Vescovi, M. and Mileham, C. and Begishev, I. A. and Klein, S. R. and Melean, R. and Muller, S. and Zou, J. and Veloso, F. and Casner, A. and Beg, F. N. and Regan, S. P.},
abstractNote = {Talbot-Lau x-ray interferometry has been implemented to map electron density gradients in High Energy Density Physics (HEDP) experiments. X-ray backlighter targets have been evaluated for Talbot-Lau X-ray Deflectometry (TXD). Cu foils, wires, and sphere targets have been irradiated by 10–150 J, 8–30 ps laser pulses, while two pulsed-power generators (~350 kA, 350 ns and ~200 kA, 150 ns) have driven Cu wire, hybrid, and laser-cut x-pinches. A plasma ablation front generated by the Omega EP laser was imaged for the first time through TXD for densities >1023 cm–3. Backlighter optimization in combination with x-ray CCD, image plates, and x-ray film has been assessed in terms of spatial resolution and interferometer contrast for accurate plasma characterization through TXD in pulsed-power and high-intensity laser environments. Furthermore, the results obtained thus far demonstrate the potential of TXD as a powerful diagnostic for HEDP.},
doi = {10.1063/5.0043655},
journal = {Review of Scientific Instruments},
number = 6,
volume = 92,
place = {United States},
year = {Fri Jun 18 00:00:00 EDT 2021},
month = {Fri Jun 18 00:00:00 EDT 2021}
}
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