Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter
Abstract
A Talbot–Lau x-ray deflectometer can map electron density gradients in high energy density plasmas, as well as provide information about plasma elemental composition through single-image x-ray refraction and attenuation measurements. A new adaptation to a pulsed power environment used backlighting from copper X-pinches, allowing for electron density mapping of a low-Z object. Even though the X-pinch backlighter is not properly optimized for emitting x-rays in terms of source size and photon fluence, Moire fringe patterns with contrast up to 14% and fringe shift due to refraction on a beryllium object are obtained. Due to the proximity of the deflectometer with the X-pinch (~6 cm), it is shown that a protective filter is required to avoid damage in the closest (i.e., source) grating due to both plasma debris and mechanical shock. Regarding grating survival, these did not show any damage due to the intense magnetic field or heating induced by plasma radiation. Electron density on beryllium was measured with a difference lower than 16%. The areal electron density mapping of the sample was limited by source size characteristics, in similarity to transmission radiography. These results show the potential of plasma electron density as well as material mapping through Talbot–Lau x-ray deflectometrymore »
- Authors:
-
[2];
[1];
[1]
- Pontificia Universidad Católica de Chile, Santiago (Chile)
- Johns Hopkins Univ., Baltimore, MD (United States)
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); Comisión Nacional de Investigación Científica y Tecnológica (CONICYT); National Fund for Scientific and Technological Development (FONDECYT)
- OSTI Identifier:
- 1631998
- Alternate Identifier(s):
- OSTI ID: 1630457
- Grant/Contract Number:
- NA0003882; NA0002955
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Volume: 127; Journal Issue: 20; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; X-ray optics; X-ray diagnostics; Plasma production; High energy density physics; Time resolved imaging; Plasma diagnostics
Citation Formats
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, and Favre, Mario. Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter. United States: N. p., 2020.
Web. doi:10.1063/5.0001910.
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, & Favre, Mario. Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter. United States. https://doi.org/10.1063/5.0001910
Vescovi, Milenko, Valdivia, Maria Pia, Veloso, Felipe, Stutman, Dan, and Favre, Mario. Fri .
"Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter". United States. https://doi.org/10.1063/5.0001910. https://www.osti.gov/servlets/purl/1631998.
@article{osti_1631998,
title = {Implementation of Talbot–Lau x-ray deflectometry in the pulsed power environment using a copper X-pinch backlighter},
author = {Vescovi, Milenko and Valdivia, Maria Pia and Veloso, Felipe and Stutman, Dan and Favre, Mario},
abstractNote = {A Talbot–Lau x-ray deflectometer can map electron density gradients in high energy density plasmas, as well as provide information about plasma elemental composition through single-image x-ray refraction and attenuation measurements. A new adaptation to a pulsed power environment used backlighting from copper X-pinches, allowing for electron density mapping of a low-Z object. Even though the X-pinch backlighter is not properly optimized for emitting x-rays in terms of source size and photon fluence, Moire fringe patterns with contrast up to 14% and fringe shift due to refraction on a beryllium object are obtained. Due to the proximity of the deflectometer with the X-pinch (~6 cm), it is shown that a protective filter is required to avoid damage in the closest (i.e., source) grating due to both plasma debris and mechanical shock. Regarding grating survival, these did not show any damage due to the intense magnetic field or heating induced by plasma radiation. Electron density on beryllium was measured with a difference lower than 16%. The areal electron density mapping of the sample was limited by source size characteristics, in similarity to transmission radiography. These results show the potential of plasma electron density as well as material mapping through Talbot–Lau x-ray deflectometry in a pulsed power environment.},
doi = {10.1063/5.0001910},
journal = {Journal of Applied Physics},
number = 20,
volume = 127,
place = {United States},
year = {Fri May 29 00:00:00 EDT 2020},
month = {Fri May 29 00:00:00 EDT 2020}
}
Free Publicly Available Full Text
Publisher's Version of Record
Other availability
Search WorldCat to find libraries that may hold this journal
Cited by: 4 works
Citation information provided by
Web of Science
Web of Science
Save to My Library
You must Sign In or Create an Account in order to save documents to your library.
Works referenced in this record:
Differential Phase X-ray Imaging Microscopy with X-ray Talbot Interferometer
journal, October 2008
- Takeda, Yoshihiro; Yashiro, Wataru; Hattori, Tadashi
- Applied Physics Express, Vol. 1
X-pinch. Part II
journal, June 2015
- Pikuz, S. A.; Shelkovenko, T. A.; Hammer, D. A.
- Plasma Physics Reports, Vol. 41, Issue 6
Compact X-pinch based point x-ray source for phase contrast imaging of inertial confinement fusion capsules
journal, September 2006
- Beg, F. N.; Stephens, R. B.; Xu, H. -W.
- Applied Physics Letters, Vol. 89, Issue 10
Precise measurement of the temperature of a silicon wafer by an optical-interference contactless thermometer during rapid plasma processing
journal, May 2020
- Kameda, Asaki; Mizukawa, Yuri; Hanafusa, Hiroaki
- Journal of Applied Physics, Vol. 127, Issue 20
Phase retrieval and differential phase-contrast imaging with low-brilliance X-ray sources
journal, March 2006
- Pfeiffer, Franz; Weitkamp, Timm; Bunk, Oliver
- Nature Physics, Vol. 2, Issue 4, p. 258-261
A review of the dense Z -pinch
journal, June 2011
- Haines, M. G.
- Plasma Physics and Controlled Fusion, Vol. 53, Issue 9
X ‐pinch soft x‐ray source for microlithography
journal, November 1990
- Hammer, D. A.; Kalantar, D. H.; Mittal, K. C.
- Applied Physics Letters, Vol. 57, Issue 20
Extreme ultraviolet imaging of wire array z-pinch experiments
journal, October 2004
- Bland, S. N.; Ampleford, D. J.; Bott, S. C.
- Review of Scientific Instruments, Vol. 75, Issue 10
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
journal, July 2016
- Valdivia, M. P.; Stutman, D.; Stoeckl, C.
- Review of Scientific Instruments, Vol. 87, Issue 11
A wide band porous silicon omnidirectional mirror for the near infrared range
journal, May 2020
- Chavez-Castillo, B. A.; Pérez-Huerta, J. S.; Madrigal-Melchor, J.
- Journal of Applied Physics, Vol. 127, Issue 20
Implementation of a Talbot–Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser
journal, February 2020
- Valdivia, M. P.; Stutman, D.; Stoeckl, C.
- Review of Scientific Instruments, Vol. 91, Issue 2
X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92
journal, July 1993
- Henke, B. L.; Gullikson, E. M.; Davis, J. C.
- Atomic Data and Nuclear Data Tables, Vol. 54, Issue 2, p. 181-342
A review of projection radiography of plasma and biological objects in X-Pinch radiation
journal, March 2016
- Shelkovenko, T. A.; Pikuz, S. A.; Hammer, D. A.
- Plasma Physics Reports, Vol. 42, Issue 3
X-ray backlighting of wire array Z -pinch implosions using X pinch
journal, January 2001
- Lebedev, S. V.; Beg, F. N.; Bland, S. N.
- Review of Scientific Instruments, Vol. 72, Issue 1
Perspectives on high-energy-density physics
journal, May 2009
- Drake, R. P.
- Physics of Plasmas, Vol. 16, Issue 5
Development of phase-contrast X-ray imaging techniques and potential medical applications
journal, September 2008
- Zhou, Shu-Ang; Brahme, Anders
- Physica Medica, Vol. 24, Issue 3, p. 129-148
High-luminosity monochromatic x-ray backlighting using an incoherent plasma source to study extremely dense plasmas (invited)
journal, January 1997
- Pikuz, S. A.; Shelkovenko, T. A.; Romanova, V. M.
- Review of Scientific Instruments, Vol. 68, Issue 1
Symmetric Inertial Confinement Fusion Implosions at Ultra-High Laser Energies
journal, January 2010
- Glenzer, S. H.; MacGowan, B. J.; Michel, P.
- Science, Vol. 327, Issue 5970
Electron Density Measurements of High Density Plasmas Using Soft X-Ray Laser Interferometry
journal, May 1995
- Da Silva, L. B.; Barbee, Jr., T. W.; Cauble, R.
- Physical Review Letters, Vol. 74, Issue 20
Moiré deflectometry using the Talbot-Lau interferometer as refraction diagnostic for High Energy Density plasmas at energies below 10 keV
journal, July 2014
- Valdivia, M. P.; Stutman, D.; Finkenthal, M.
- Review of Scientific Instruments, Vol. 85, Issue 7
XWFP: an x-ray wavefront propagation software package for the IDL computer language
conference, October 2004
- Weitkamp, Timm; Sanchez del Rio, Manuel
Single-shot Z_eff dense plasma diagnostic through simultaneous refraction and attenuation measurements with a Talbot–Lau x-ray moiré deflectometer
journal, January 2015
- Valdivia, M. P.; Stutman, D.; Finkenthal, M.
- Applied Optics, Vol. 54, Issue 10
Experimental Demonstration of Fusion-Relevant Conditions in Magnetized Liner Inertial Fusion
journal, October 2014
- Gomez, M. R.; Slutz, S. A.; Sefkow, A. B.
- Physical Review Letters, Vol. 113, Issue 15
X-ray phase imaging with a grating interferometer
journal, January 2005
- Weitkamp, Timm; Diaz, Ana; David, Christian
- Optics Express, Vol. 13, Issue 16
Point-projection x-ray radiography using an X pinch as the radiation source
journal, January 2001
- Shelkovenko, T. A.; Sinars, D. B.; Pikuz, S. A.
- Review of Scientific Instruments, Vol. 72, Issue 1
The x ‐pinch as a point source of x rays for backlighting
journal, January 1995
- Kalantar, D. H.; Hammer, D. A.
- Review of Scientific Instruments, Vol. 66, Issue 1
The fractional Talbot effect in differential x-ray phase-contrast imaging for extended and polychromatic x-ray sources
journal, October 2008
- Engelhardt, M.; Kottler, C.; Bunk, O.
- Journal of Microscopy, Vol. 232, Issue 1, p. 145-157
Talbot-Lau based Moiré deflectometry with non-coherent sources as potential High Energy Density plasma diagnostic
journal, October 2013
- Valdivia, M. P.; Stutman, D.; Finkenthal, M.
- Journal of Applied Physics, Vol. 114, Issue 16
Pulsed-power-driven high energy density physics and inertial confinement fusion research
journal, May 2005
- Matzen, M. Keith; Sweeney, M. A.; Adams, R. G.
- Physics of Plasmas, Vol. 12, Issue 5
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics
journal, February 2016
- Valdivia, M. P.; Stutman, D.; Stoeckl, C.
- Review of Scientific Instruments, Vol. 87, Issue 2
Radiographic and spectroscopic studies of X-pinch plasma implosion dynamics and x-ray burst emission characteristics
journal, January 2001
- Shelkovenko, T. A.; Sinars, D. B.; Pikuz, S. A.
- Physics of Plasmas, Vol. 8, Issue 4
A Compact X-pinch X-ray Source for Characterization of Inertial Confinement Fusion Capsules
conference, January 2006
- Beg, F. N.
- DENSE Z-PINCHES: 6th International Conference on Dense Z-Pinches, AIP Conference Proceedings
Slit-wire camera, a new diagnostics method for measurement of small scale high-energy density structures in hot plasmas
journal, June 2002
- Choi, P.; Dumitrescu, C.; Wyndham, E.
- Review of Scientific Instruments, Vol. 73, Issue 6
Study of New Configurations of Hybrid $X$ Pinches
journal, March 2014
- Shelkovenko, Tatiana A.; Pikuz, Sergey A.; Hoyt, Cad L.
- IEEE Transactions on Plasma Science, Vol. 42, Issue 3