Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments
Abstract
Talbot–Lau x-ray interferometry uses incoherent x-ray sources to measure refraction index changes in matter. These measurements can provide accurate electron density mapping through phase retrieval. An adaptation of the interferometer has been developed in order to meet the specific requirements of high-energy density experiments. This adaptation is known as a moiré deflectometer, which allows for single-shot capabilities in the form of interferometric fringe patterns. The moiré x-ray deflectometry technique requires a set of object and reference images in order to provide electron density maps, which can be costly in the high-energy density environment. In particular, synthetic reference phase images obtained ex situ through a phase-scan procedure, can provide a feasible solution. To test this procedure, an object phasemap was retrieved from a single-shot moiré image obtained from a plasma-produced x-ray source. A reference phase map was then obtained from phase-stepping measurements using a continuous x-ray tube source in a small laboratory setting. Ultimately, the two phase maps were used to retrieve an electron density map. A comparison of the moiré and phase-stepping phase-retrieval methods was performed to evaluate single-exposure plasma electron density mapping for high-energy density and other transient plasma experiments. It was found that a combination of phase-retrieval methodsmore »
- Authors:
-
- Johns Hopkins Univ., Baltimore, MD (United States). Dept. of Physics and Astronomy
- Univ. of Rochester, NY (United States). Lab. for Laser Energetics
- Publication Date:
- Research Org.:
- Johns Hopkins Univ., Baltimore, MD (United States); Univ. of Rochester, NY (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA)
- OSTI Identifier:
- 1430099
- Alternate Identifier(s):
- OSTI ID: 1415326
- Grant/Contract Number:
- NA0002955
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Optics
- Additional Journal Information:
- Journal Volume: 57; Journal Issue: 2; Journal ID: ISSN 1559-128X
- Publisher:
- Optical Society of America
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; 46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
Citation Formats
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, and Regan, Sean P. Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments. United States: N. p., 2018.
Web. doi:10.1364/AO.57.000138.
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, & Regan, Sean P. Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments. United States. https://doi.org/10.1364/AO.57.000138
Valdivia, Maria Pia, Stutman, Dan, Stoeckl, Christian, Mileham, Chad, Begishev, Ildar A., Bromage, Jake, and Regan, Sean P. Wed .
"Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments". United States. https://doi.org/10.1364/AO.57.000138. https://www.osti.gov/servlets/purl/1430099.
@article{osti_1430099,
title = {Talbot–Lau x-ray deflectometry phase-retrieval methods for electron density diagnostics in high-energy density experiments},
author = {Valdivia, Maria Pia and Stutman, Dan and Stoeckl, Christian and Mileham, Chad and Begishev, Ildar A. and Bromage, Jake and Regan, Sean P.},
abstractNote = {Talbot–Lau x-ray interferometry uses incoherent x-ray sources to measure refraction index changes in matter. These measurements can provide accurate electron density mapping through phase retrieval. An adaptation of the interferometer has been developed in order to meet the specific requirements of high-energy density experiments. This adaptation is known as a moiré deflectometer, which allows for single-shot capabilities in the form of interferometric fringe patterns. The moiré x-ray deflectometry technique requires a set of object and reference images in order to provide electron density maps, which can be costly in the high-energy density environment. In particular, synthetic reference phase images obtained ex situ through a phase-scan procedure, can provide a feasible solution. To test this procedure, an object phasemap was retrieved from a single-shot moiré image obtained from a plasma-produced x-ray source. A reference phase map was then obtained from phase-stepping measurements using a continuous x-ray tube source in a small laboratory setting. Ultimately, the two phase maps were used to retrieve an electron density map. A comparison of the moiré and phase-stepping phase-retrieval methods was performed to evaluate single-exposure plasma electron density mapping for high-energy density and other transient plasma experiments. It was found that a combination of phase-retrieval methods can deliver accurate refraction angle mapping. Once x-ray backlighter quality is optimized, the ex situ method is expected to deliver electron density mapping with improved resolution. The steps necessary for improved diagnostic performance are discussed.},
doi = {10.1364/AO.57.000138},
journal = {Applied Optics},
number = 2,
volume = 57,
place = {United States},
year = {Wed Jan 03 00:00:00 EST 2018},
month = {Wed Jan 03 00:00:00 EST 2018}
}
Web of Science
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