Long wavelength, high gain InAsSb strained-layer superlattice photoconductive detectors
Patent
·
OSTI ID:868066
- Albuquerque, NM
A high gain photoconductive device for 8 to 12 .mu.m wavelength radiation including an active semiconductor region extending from a substrate to an exposed face, the region comprising a strained-layer superlattice of alternating layers of two different InAs.sub.1-x Sb.sub.x compounds having x>0.75. A pair of spaced electrodes are provided on the exposed face, and changes in 8 to 12 .mu.m radiation on the exposed face cause a large photoconductive gain between the spaced electrodes.
- Research Organization:
- AT&T
- DOE Contract Number:
- AC04-76DP00789
- Assignee:
- United States of America as represented by United States (Washington, DC)
- Patent Number(s):
- US 5065205
- OSTI ID:
- 868066
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
wavelength
inassb
strained-layer
superlattice
photoconductive
detectors
device
12
radiation
including
active
semiconductor
region
extending
substrate
exposed
comprising
alternating
layers
inas
1-x
sb
compounds
75
pair
spaced
electrodes
provided
changes
spaced electrodes
strained-layer superlattice
region extending
wavelength radiation
alternating layers
active semiconductor
photoconductive detector
radiation including
layer superlattice
/257/
inassb
strained-layer
superlattice
photoconductive
detectors
device
12
radiation
including
active
semiconductor
region
extending
substrate
exposed
comprising
alternating
layers
inas
1-x
sb
compounds
75
pair
spaced
electrodes
provided
changes
spaced electrodes
strained-layer superlattice
region extending
wavelength radiation
alternating layers
active semiconductor
photoconductive detector
radiation including
layer superlattice
/257/