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Title: Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy

Abstract

Monitoring the charged defect concentration at the nanoscale is of critical importance for both the fundamental science and applications of ferroelectrics. However, up-to-date, high-resolution study methods for the investigation of structural defects, such as transmission electron microscopy, X-ray tomography, etc., are expensive and demand complicated sample preparation. Here, with an example of the lanthanum-doped bismuth ferrite ceramics, a novel method is proposed based on the switching spectroscopy piezoresponse force microscopy (SSPFM) that allows probing the electric potential from buried subsurface charged defects in the ferroelectric materials with a nanometer-scale spatial resolution. When compared with the composition-sensitive methods, such as neutron diffraction, X-ray photoelectron spectroscopy, and local time-of-flight secondary ion mass spectrometry, the SSPFM sensitivity to the variation of the electric potential from the charged defects is shown to be equivalent to less than 0.3 at% of the defect concentration. Additionally, the possibility to locally evaluate dynamics of the polarization screening caused by the charged defects is demonstrated, which is of significant interest for further understanding defect-mediated processes in ferroelectrics.

Authors:
ORCiD logo [1];  [1];  [1]; ORCiD logo [2];  [1];  [3];  [4];  [4];  [1];  [5];  [6]
+ Show Author Affiliations
  1. Ural Federal Univ., Ekaterinburg (Russian Federation)
  2. Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
  3. National Academy of Sciences (NAS) of Belarus, Minsk (Belarus)
  4. Xi'an Univ. of Technology, Shaanxi (China)
  5. Univ. of Aveiro (Portugal)
  6. Ural Federal Univ., Ekaterinburg (Russian Federation); Univ. of Aveiro (Portugal); Tomsk Polytechnic Institute (Russian Federation)
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Scientific User Facilities Division; Russian Science Foundation; Centre for Research in Ceramics and Composite Materials (CICECO)
OSTI Identifier:
1885278
Grant/Contract Number:  
AC05-00OR22725; 19-72-10076; UIDB/50011/2020; UIDP/50011/2020
Resource Type:
Accepted Manuscript
Journal Name:
Small Methods
Additional Journal Information:
Journal Volume: 6; Journal Issue: 2; Journal ID: ISSN 2366-9608
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
42 ENGINEERING; bias field; domain walls; hysteresis loops; polarization reversal; screening, vacancies

Citation Formats

Alikin, Denis, Abramov, Alexander, Turygin, Anton, Ievlev, Anton, Pryakhina, Victoria, Karpinsky, Dmitry, Hu, Qingyuan, Jin, Li, Shur, Vladimir, Tselev, Alexander, and Kholkin, Andrei. Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy. United States: N. p., 2021. Web. doi:10.1002/smtd.202101289.
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Alikin, Denis, Abramov, Alexander, Turygin, Anton, Ievlev, Anton, Pryakhina, Victoria, Karpinsky, Dmitry, Hu, Qingyuan, Jin, Li, Shur, Vladimir, Tselev, Alexander, & Kholkin, Andrei. Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy. United States. https://doi.org/10.1002/smtd.202101289
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Alikin, Denis, Abramov, Alexander, Turygin, Anton, Ievlev, Anton, Pryakhina, Victoria, Karpinsky, Dmitry, Hu, Qingyuan, Jin, Li, Shur, Vladimir, Tselev, Alexander, and Kholkin, Andrei. Wed . "Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy". United States. https://doi.org/10.1002/smtd.202101289. https://www.osti.gov/servlets/purl/1885278.
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@article{osti_1885278,
title = {Exploring Charged Defects in Ferroelectrics by the Switching Spectroscopy Piezoresponse Force Microscopy},
author = {Alikin, Denis and Abramov, Alexander and Turygin, Anton and Ievlev, Anton and Pryakhina, Victoria and Karpinsky, Dmitry and Hu, Qingyuan and Jin, Li and Shur, Vladimir and Tselev, Alexander and Kholkin, Andrei},
abstractNote = {Monitoring the charged defect concentration at the nanoscale is of critical importance for both the fundamental science and applications of ferroelectrics. However, up-to-date, high-resolution study methods for the investigation of structural defects, such as transmission electron microscopy, X-ray tomography, etc., are expensive and demand complicated sample preparation. Here, with an example of the lanthanum-doped bismuth ferrite ceramics, a novel method is proposed based on the switching spectroscopy piezoresponse force microscopy (SSPFM) that allows probing the electric potential from buried subsurface charged defects in the ferroelectric materials with a nanometer-scale spatial resolution. When compared with the composition-sensitive methods, such as neutron diffraction, X-ray photoelectron spectroscopy, and local time-of-flight secondary ion mass spectrometry, the SSPFM sensitivity to the variation of the electric potential from the charged defects is shown to be equivalent to less than 0.3 at% of the defect concentration. Additionally, the possibility to locally evaluate dynamics of the polarization screening caused by the charged defects is demonstrated, which is of significant interest for further understanding defect-mediated processes in ferroelectrics.},
doi = {10.1002/smtd.202101289},
journal = {Small Methods},
number = 2,
volume = 6,
place = {United States},
year = {Wed Dec 29 00:00:00 EST 2021},
month = {Wed Dec 29 00:00:00 EST 2021}
}
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