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Title: Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials

Abstract

The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.

Authors:
 [1];  [1];  [1]
  1. ORNL
Publication Date:
Research Org.:
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Sponsoring Org.:
USDOE Office of Science (SC)
OSTI Identifier:
978057
DOE Contract Number:  
DE-AC05-00OR22725
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 88; Journal Issue: 6
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; FERROELECTRIC MATERIALS; HYSTERESIS; KINETICS; MICROSCOPY; MICROSTRUCTURE; POLARIZATION; SATURATION; SPECTROSCOPY; THERMODYNAMICS

Citation Formats

Jesse, Stephen, Baddorf, Arthur P, and Kalinin, Sergei V. Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials. United States: N. p., 2006. Web. doi:10.1063/1.2172216.
Jesse, Stephen, Baddorf, Arthur P, & Kalinin, Sergei V. Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials. United States. doi:10.1063/1.2172216.
Jesse, Stephen, Baddorf, Arthur P, and Kalinin, Sergei V. Sun . "Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials". United States. doi:10.1063/1.2172216.
@article{osti_978057,
title = {Switching Spectroscopy Piezoresponse Force Microscopy of Ferroelectric Materials},
author = {Jesse, Stephen and Baddorf, Arthur P and Kalinin, Sergei V},
abstractNote = {The application of ferroelectric materials for electronic devices necessitates the quantitative study of local switching behavior, including imprint, coercive bias, remanent and saturation responses, and work of switching. Here we introduce switching spectroscopy piezoresponse force microscopy as a tool for real-space imaging of switching properties on the nanoscale. The hysteresis curves, acquired at each point in the image, are analyzed in the thermodynamic and kinetic limits. We expect that this approach will further understanding of the relationships between material microstructure and polarization switching phenomena on the nanoscale, and provide a quantitative tool for ferroelectric-based device characterization.},
doi = {10.1063/1.2172216},
journal = {Applied Physics Letters},
number = 6,
volume = 88,
place = {United States},
year = {Sun Jan 01 00:00:00 EST 2006},
month = {Sun Jan 01 00:00:00 EST 2006}
}