High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating
- Authors:
-
[1];
[1];
- Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1224580
- Grant/Contract Number:
- FG02-10ER46774; SC0005038
- Resource Type:
- Publisher's Accepted Manuscript
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Name: Review of Scientific Instruments Journal Volume: 86 Journal Issue: 10; Journal ID: ISSN 0034-6748
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Adnane, L., Williams, N., Silva, H., and Gokirmak, A. High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating. United States: N. p., 2015.
Web. doi:10.1063/1.4934577.
Adnane, L., Williams, N., Silva, H., & Gokirmak, A. High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating. United States. https://doi.org/10.1063/1.4934577
Adnane, L., Williams, N., Silva, H., and Gokirmak, A. Wed .
"High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating". United States. https://doi.org/10.1063/1.4934577.
@article{osti_1224580,
title = {High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating},
author = {Adnane, L. and Williams, N. and Silva, H. and Gokirmak, A.},
abstractNote = {},
doi = {10.1063/1.4934577},
journal = {Review of Scientific Instruments},
number = 10,
volume = 86,
place = {United States},
year = {Wed Oct 28 00:00:00 EDT 2015},
month = {Wed Oct 28 00:00:00 EDT 2015}
}
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https://doi.org/10.1063/1.4934577
https://doi.org/10.1063/1.4934577
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