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Title: High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating

Authors:
ORCiD logo [1] ;  [1] ; ORCiD logo [1] ;  [1]
  1. Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
Publication Date:
Grant/Contract Number:
FG02-10ER46774; SC0005038
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 10; Related Information: CHORUS Timestamp: 2018-03-29 14:09:18; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1224580