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Title: Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material

Authors:
; ; ; ;
Publication Date:
Research Org.:
Energy Frontier Research Centers (EFRC) (United States). Center for Energy Efficient Materials (CEEM)
Sponsoring Org.:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
OSTI Identifier:
1382263
DOE Contract Number:  
SC0001009
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 83; Journal Issue: 9; Related Information: CEEM partners with the University of California, Santa Barbara (lead); Purdue University; Los Alamos National Laboratory; National Renewable Energy Laboratory; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)
Country of Publication:
United States
Language:
English
Subject:
solar (photovoltaic), solid state lighting, phonons, thermoelectric, bio-inspired, energy storage (including batteries and capacitors), electrodes - solar, defects, charge transport, materials and chemistry by design, optics, synthesis (novel materials), synthesis (self-assembly), synthesis (scalable processing)

Citation Formats

Ramu, Ashok T., Mages, Phillip, Zhang, Chong, Imamura, Jeffrey T., and Bowers, John E. Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material. United States: N. p., 2012. Web. doi:10.1063/1.4754714.
Ramu, Ashok T., Mages, Phillip, Zhang, Chong, Imamura, Jeffrey T., & Bowers, John E. Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material. United States. doi:10.1063/1.4754714.
Ramu, Ashok T., Mages, Phillip, Zhang, Chong, Imamura, Jeffrey T., and Bowers, John E. Sat . "Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material". United States. doi:10.1063/1.4754714.
@article{osti_1382263,
title = {Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material},
author = {Ramu, Ashok T. and Mages, Phillip and Zhang, Chong and Imamura, Jeffrey T. and Bowers, John E.},
abstractNote = {},
doi = {10.1063/1.4754714},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 9,
volume = 83,
place = {United States},
year = {2012},
month = {9}
}

Works referenced in this record:

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