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Title: High temperature Hall measurement setup for thin film characterization

Authors:
ORCiD logo [1] ;  [1] ; ORCiD logo [1]
  1. Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
Publication Date:
Grant/Contract Number:
FG02-10ER46774; SC0005038
Type:
Publisher's Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 87; Journal Issue: 7; Related Information: CHORUS Timestamp: 2017-09-11 20:47:46; Journal ID: ISSN 0034-6748
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1272653