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Title: High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films

Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [1] ;  [3] ;  [3] ;  [1] ;  [1] ; ORCiD logo [1]
  1. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
  2. Department of Electrical and Electronics Engineering, Eskisehir Osmangazi University, Eskisehir 26480, Turkey
  3. IBM Watson Research Center, Yorktown Heights, New York 10598, USA
Publication Date:
Grant/Contract Number:
SC005038
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Name: Journal of Applied Physics Journal Volume: 122 Journal Issue: 12; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1394681

Adnane, L., Dirisaglik, F., Cywar, A., Cil, K., Zhu, Y., Lam, C., Anwar, A. F. M., Gokirmak, A., and Silva, H.. High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films. United States: N. p., Web. doi:10.1063/1.4996218.
Adnane, L., Dirisaglik, F., Cywar, A., Cil, K., Zhu, Y., Lam, C., Anwar, A. F. M., Gokirmak, A., & Silva, H.. High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films. United States. doi:10.1063/1.4996218.
Adnane, L., Dirisaglik, F., Cywar, A., Cil, K., Zhu, Y., Lam, C., Anwar, A. F. M., Gokirmak, A., and Silva, H.. 2017. "High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films". United States. doi:10.1063/1.4996218.
@article{osti_1394681,
title = {High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films},
author = {Adnane, L. and Dirisaglik, F. and Cywar, A. and Cil, K. and Zhu, Y. and Lam, C. and Anwar, A. F. M. and Gokirmak, A. and Silva, H.},
abstractNote = {},
doi = {10.1063/1.4996218},
journal = {Journal of Applied Physics},
number = 12,
volume = 122,
place = {United States},
year = {2017},
month = {9}
}

Works referenced in this record:

Complex thermoelectric materials
journal, February 2008
  • Snyder, G. Jeffrey; Toberer, Eric S.
  • Nature Materials, Vol. 7, Issue 2, p. 105-114
  • DOI: 10.1038/nmat2090

Enhancement of Thermoelectric Efficiency in PbTe by Distortion of the Electronic Density of States
journal, July 2008
  • Heremans, J. P.; Jovovic, V.; Toberer, E. S.
  • Science, Vol. 321, Issue 5888, p. 554-557
  • DOI: 10.1126/science.1159725