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This content will become publicly available on September 25, 2018

Title: High temperature electrical resistivity and Seebeck coefficient of Ge 2 Sb 2 Te 5 thin films

Authors:
ORCiD logo [1] ;  [2] ;  [1] ;  [1] ;  [3] ;  [3] ;  [1] ;  [1] ; ORCiD logo [1]
  1. Department of Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA
  2. Department of Electrical and Electronics Engineering, Eskisehir Osmangazi University, Eskisehir 26480, Turkey
  3. IBM Watson Research Center, Yorktown Heights, New York 10598, USA
Publication Date:
Grant/Contract Number:
SC005038
Type:
Publisher's Accepted Manuscript
Journal Name:
Journal of Applied Physics
Additional Journal Information:
Journal Volume: 122; Journal Issue: 12; Related Information: CHORUS Timestamp: 2018-02-14 14:22:03; Journal ID: ISSN 0021-8979
Publisher:
American Institute of Physics
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
OSTI Identifier:
1394681