Measurement of the high-temperature Seebeck coefficient of thin films by means of an epitaxially regrown thermometric reference material

Journal Article · Sun Jan 01 00:00:00 EST 2012 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4754714· OSTI ID:1105564

Ramu, A. T.; Mages, P.; Zhang, C.; Imamura, J. T.; Bowers, J. E.

• Research Organization: Energy Frontier Research Centers (EFRC) (United States). Center for Energy Efficient Materials (CEEM)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• DOE Contract Number: SC0001009
• OSTI ID: 1105564
• Journal Information: Review of Scientific Instruments, Vol. 83; Related Information: CEEM partners with the University of California, Santa Barbara (lead); Purdue University; Los Alamos National Laboratory; National Renewable Energy Laboratory
• Country of Publication: United States
• Language: English

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