Patterned nanochannel sacrificial layer for semiconductor substrate reuse
Abstract
Described herein are systems and methods of utilizing nanochannels generated in the sacrificial layer of a semiconductor substrate to increase epitaxial lift-off speeds and facilitate reusability of GaAs substrates. The provided systems and methods may utilize unique nanochannel geometries to increase the surface area exposed to the etchant and further decrease etch times.
- Inventors:
- Issue Date:
- Research Org.:
- National Renewable Energy Laboratory (NREL), Golden, CO (United States)
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 2293930
- Patent Number(s):
- 11830733
- Application Number:
- 17/656,762
- Assignee:
- Alliance for Sustainable Energy, LLC (Golden, CO)
- DOE Contract Number:
- AC36-08GO28308
- Resource Type:
- Patent
- Resource Relation:
- Patent File Date: 03/28/2022
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Mangum, John Stanley, McMahon, William Edwin, Warren, Emily Lowell, and Theingi, San. Patterned nanochannel sacrificial layer for semiconductor substrate reuse. United States: N. p., 2023.
Web.
Mangum, John Stanley, McMahon, William Edwin, Warren, Emily Lowell, & Theingi, San. Patterned nanochannel sacrificial layer for semiconductor substrate reuse. United States.
Mangum, John Stanley, McMahon, William Edwin, Warren, Emily Lowell, and Theingi, San. Tue .
"Patterned nanochannel sacrificial layer for semiconductor substrate reuse". United States. https://www.osti.gov/servlets/purl/2293930.
@article{osti_2293930,
title = {Patterned nanochannel sacrificial layer for semiconductor substrate reuse},
author = {Mangum, John Stanley and McMahon, William Edwin and Warren, Emily Lowell and Theingi, San},
abstractNote = {Described herein are systems and methods of utilizing nanochannels generated in the sacrificial layer of a semiconductor substrate to increase epitaxial lift-off speeds and facilitate reusability of GaAs substrates. The provided systems and methods may utilize unique nanochannel geometries to increase the surface area exposed to the etchant and further decrease etch times.},
doi = {},
journal = {},
number = ,
volume = ,
place = {United States},
year = {2023},
month = {11}
}
Works referenced in this record:
Crystal structure and thermal expansion of α‐quartz SiO 2 at low temperatures
journal, October 1982
- Lager, G. A.; Jorgensen, J. D.; Rotella, F. J.
- Journal of Applied Physics, Vol. 53, Issue 10
Multiple release layer study of the intrinsic lateral etch rate of the epitaxial lift-off process
journal, November 2004
- Voncken, M. M. A. J.; Schermer, J. J.; Bauhuis, G. J.
- Applied Physics A, Vol. 79, Issue 7
High rate epitaxial lift-off of InGaP films from GaAs substrates
journal, April 2000
- Schermer, J. J.; Bauhuis, G. J.; Mulder, P.
- Applied Physics Letters, Vol. 76, Issue 15
Epitaxial lift-off process for gallium arsenide substrate reuse and flexible electronics
journal, March 2013
- Cheng, Cheng-Wei; Shiu, Kuen-Ting; Li, Ning
- Nature Communications, Vol. 4, Issue 1
Extreme selectivity in the lift‐off of epitaxial GaAs films
journal, December 1987
- Yablonovitch, Eli; Gmitter, T.; Harbison, J. P.
- Applied Physics Letters, Vol. 51, Issue 26, p. 2222-2224
GaAs photovoltaics and optoelectronics using releasable multilayer epitaxial assemblies
journal, May 2010
- Yoon, Jongseung; Jo, Sungjin; Chun, Ik Su
- Nature, Vol. 465, Issue 7296