High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy

Conference · Mon Jun 06 04:00:00 EDT 2005

OSTI ID:877916

Barty, A

Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 877916
• Report Number(s): UCRL-CONF-213044
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ALGORITHMS
ALIGNMENT
AUTOMATION
DIFFRACTION
MICROSCOPY
RESOLUTION
STABILITY
X-RAY DIFFRACTION