High-resolution ab initio Three-dimensional X-ray Diffraction Microscopy

Journal Article · Fri Aug 19 04:00:00 EDT 2005 · Journal of the Optical Society of America A

OSTI ID:883620

Chapman, H N; Barty, A; Marchesini, S; Noy, A; Cui, C; Howells, M R; Rosen, R; He, H; Spence, J H; Weierstall, U; Beetz, T; Jacobsen, C; Shapiro, D

Coherent X-ray diffraction microscopy is a method of imaging non-periodic isolated objects at resolutions only limited, in principle, by the largest scattering angles recorded. We demonstrate X-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the 3D diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a non-periodic object. We also construct 2D images of thick objects with infinite depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution using X-ray undulator radiation, and establishes the techniques to be used in atomic-resolution ultrafast imaging at X-ray free-electron laser sources.

• Research Organization: Lawrence Livermore National Laboratory (LLNL), Livermore, CA
• Sponsoring Organization: USDOE
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 883620
• Report Number(s): UCRL-JRNL-214796
• Journal Information: Journal of the Optical Society of America A, Journal Name: Journal of the Optical Society of America A Journal Issue: 5 Vol. 23
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION
DIMENSIONS
FREE ELECTRON LASERS
MICROSCOPY
RESOLUTION
SCATTERING
SHAPE
WIGGLER MAGNETS
X-RAY DIFFRACTION