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High-resolution ab initio three-dimensional x-ray diffraction microscopy

Journal Article · · Journal of the Optical Society of America. A, Optics, Image Science, and Vision
 [1];  [2];  [2];  [2];  [3];  [3];  [3];  [3];  [4];  [4];  [4];  [5];  [5];  [5]
  1. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States); Argonne National Laboratory
  2. Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  3. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
  4. Arizona State Univ., Tempe, AZ (United States) Dept. Physics and Astronomy
  5. Stony Brook Univ., NY (United States) Dept. Physics and Astronomy
Coherent x-ray diffraction microscopy is a method of imaging nonperiodic isolated objects at resolutions limited, in principle, by only the wavelength and largest scattering angles recorded. We demonstrate x-ray diffraction imaging with high resolution in all three dimensions, as determined by a quantitative analysis of the reconstructed volume images. These images are retrieved from the three-dimensional diffraction data using no a priori knowledge about the shape or composition of the object, which has never before been demonstrated on a nonperiodic object. We also construct two-dimensional images of thick objects with greatly increased depth of focus (without loss of transverse spatial resolution). These methods can be used to image biological and materials science samples at high resolution with x-ray undulator radiation and establishes the techniques to be used in atomic-resolution ultrafast imaging at x-ray free-electron laser sources.
Research Organization:
Stony Brook Univ., NY (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)
Grant/Contract Number:
FG02-04ER46128
OSTI ID:
1164141
Journal Information:
Journal of the Optical Society of America. A, Optics, Image Science, and Vision, Journal Name: Journal of the Optical Society of America. A, Optics, Image Science, and Vision Journal Issue: 5 Vol. 23; ISSN 1084-7529
Publisher:
Optical Society of America (OSA)Copyright Statement
Country of Publication:
United States
Language:
English

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