Phase Aberrations in Diffraction Microscopy
Conference
·
OSTI ID:883546
In coherent X-ray diffraction microscopy the diffraction pattern generated by a sample illuminated with coherent x-rays is recorded, and a computer algorithm recovers the unmeasured phases to synthesize an image. By avoiding the use of a lens the resolution is limited, in principle, only by the largest scattering angles recorded. However, the imaging task is shifted from the experiment to the computer, and the algorithm's ability to recover meaningful images in the presence of noise and limited prior knowledge may produce aberrations in the reconstructed image. We analyze the low order aberrations produced by our phase retrieval algorithms. We present two methods to improve the accuracy and stability of reconstructions.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 883546
- Report Number(s):
- UCRL-PROC-215873
- Country of Publication:
- United States
- Language:
- English
Similar Records
High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy
Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
Recovering magnetization distributions from their noisy diffraction data
Conference
·
Mon Jun 06 00:00:00 EDT 2005
·
OSTI ID:877916
Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
Journal Article
·
Sun Jan 13 23:00:00 EST 2008
· Applied Physics Letters
·
OSTI ID:21016284
Recovering magnetization distributions from their noisy diffraction data
Journal Article
·
Tue Dec 14 23:00:00 EST 2010
· Physical Review. E, Statistical, Nonlinear, and Soft Matter Physics (Print)
·
OSTI ID:21502895