Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes

Journal Article · Mon Jan 14 04:00:00 EST 2008 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.2834372· OSTI ID:21016284

Kamimura, Osamu; Doi, Takahisa; Dobashi, Takashi ^[1]; Kawahara, Kota; Abe, Takashi; Gohara, Kazutoshi ^[2]

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1. Central Research Laboratory, Hitachi, Ltd., 1-280 Higashi-koigakubo Kokubunji-shi, Tokyo 185-8601 (Japan)
2. Division of Applied Physics, Graduate School of Engineering, Hokkaido University, Sapporo 063-8628 (Japan)

Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm.

• OSTI ID: 21016284
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 2 Vol. 92; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CARBON
ELECTRON BEAMS
ELECTRON DIFFRACTION
ELECTRON MICROSCOPY
IMAGE PROCESSING
IMAGES
ITERATIVE METHODS
NANOTUBES
TWO-DIMENSIONAL CALCULATIONS