High-resolution ab-initio three-dimensional coherence X-ray diffraction microscopy
Three-dimensional diffraction microscopy offers the potential for high-resolution aberration-free diffraction-limited 3D images without the resolution and depth-of-field limitations of lens-based tomographic systems. Critical issues in obtaining a high-quality image include: (1) Data collection--signal to noise, system stability, dynamic range, automation; (2) Alignment of diffraction patterns with respect to one another; (3) Assembly of the diffraction data into a diffraction volume; and (4) Efficient algorithms for applying phase retrieval techniques to the diffraction volume; (5) Stability of the three-dimensional phase retrieval process; (6) Techniques for determining the object support; and (7) Treatment of missing data, both within the beamstop region and elsewhere. They have obtained high-quality 3D reconstructions from X-ray diffraction data alone. This is an important step, as it does not require a low-resolution image to fill in the beamstop region.
- Research Organization:
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 877916
- Report Number(s):
- UCRL-CONF-213044; TRN: US200608%%751
- Resource Relation:
- Conference: Presented at: Coherence 2005, Porquerolles, France, Jun 14 - Jun 18, 2005
- Country of Publication:
- United States
- Language:
- English
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