Reflective optical imaging systems with balanced distortion
Patent
·
OSTI ID:873706
- San Ramon, CA
Optical systems compatible with extreme ultraviolet radiation comprising four reflective elements for projecting a mask image onto a substrate are described. The four optical elements comprise, in order from object to image, convex, concave, convex and concave mirrors. The optical systems are particularly suited for step and scan lithography methods. The invention enables the use of larger slit dimensions associated with ring field scanning optics, improves wafer throughput, and allows higher semiconductor device density. The inventive optical systems are characterized by reduced dynamic distortion because the static distortion is balanced across the slit width.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- Regents of University of California (Oakland, CA)
- Patent Number(s):
- US 6226346
- OSTI ID:
- 873706
- Country of Publication:
- United States
- Language:
- English
Optical system design issues in development of projection camera for EUV lithography
|
conference | May 1995 |
Reflective optical designs for soft x-ray projection lithography
|
conference | December 1991 |
Design of reflective relay for soft x-ray lithography
|
conference | January 1991 |
Reflective systems design study for soft x-ray projection lithography
|
journal | November 1990 |
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/378/
allows
associated
balanced
balanced distortion
characterized
compatible
comprise
comprising
concave
concave mirror
concave mirrors
convex
density
described
device
device density
dimensions
dimensions associated
distortion
dynamic
dynamic distortion
elements
elements comprise
enables
extreme
extreme ultraviolet
field
field scanning
image
imaging
imaging systems
improves
improves wafer
inventive
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mask
mask image
methods
mirrors
optical
optical element
optical elements
optical imaging
optical systems
optics
particularly
particularly suited
projecting
radiation
radiation comprising
reduced
reduced dynamic
reflective
reflective element
reflective elements
reflective optical
scan
scan lithography
scanning
scanning optics
semiconductor
semiconductor device
slit
slit dimensions
slit width
static
static distortion
step
substrate
suited
systems
throughput
ultraviolet
ultraviolet radiation
wafer
wafer throughput
width
allows
associated
balanced
balanced distortion
characterized
compatible
comprise
comprising
concave
concave mirror
concave mirrors
convex
density
described
device
device density
dimensions
dimensions associated
distortion
dynamic
dynamic distortion
elements
elements comprise
enables
extreme
extreme ultraviolet
field
field scanning
image
imaging
imaging systems
improves
improves wafer
inventive
larger
lithography
lithography methods
mask
mask image
methods
mirrors
optical
optical element
optical elements
optical imaging
optical systems
optics
particularly
particularly suited
projecting
radiation
radiation comprising
reduced
reduced dynamic
reflective
reflective element
reflective elements
reflective optical
scan
scan lithography
scanning
scanning optics
semiconductor
semiconductor device
slit
slit dimensions
slit width
static
static distortion
step
substrate
suited
systems
throughput
ultraviolet
ultraviolet radiation
wafer
wafer throughput
width