Electrical Breakdown of Thin Oxides During Ramped Current-Temperature Stress
Journal Article
·
· IEEE Transactions on Nuclear Science (Dec. 2000)
- Sandia National Laboratories
No abstract prepared.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (US); Sandia National Labs., Livermore, CA (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 760007
- Report Number(s):
- SAND2000-1997J
- Journal Information:
- IEEE Transactions on Nuclear Science (Dec. 2000), Journal Name: IEEE Transactions on Nuclear Science (Dec. 2000)
- Country of Publication:
- United States
- Language:
- English
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