CMOS IC I sub DDQ testing for the 1990s
Conference
·
OSTI ID:7004999
- Sandia National Labs., Albuquerque, NM (USA)
- New Mexico Univ., Albuquerque, NM (USA). Dept. of Electrical and Computer Engineering
Significant improvements in CMOSIC quality, reliability, and fabrication yield can be readily achieved in the 1990s by appropriate implementation of tests for quiescent power supply current (I{sub DDQ}). As part of an overall quality management program, I{sub DDQ} testing incorporated with design for testability and modified conventional logic response testing enables 100% stuck-at fault coverage, quality improvement goals of defective levels less than 100 PPM, and reliability greater than 0.999 for 30 years. 9 refs., 2 figs., 1 tab.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- Sponsoring Organization:
- DOE/DP
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 7004999
- Report Number(s):
- SAND-90-0613C; CONF-9004174--1; ON: DE90009508
- Country of Publication:
- United States
- Language:
- English
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· Proceedings of the IEEE 1991 Custom Integrated Circuits Conference
·
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Related Subjects
36 MATERIALS SCIENCE
360601* -- Other Materials-- Preparation & Manufacture
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
AUTOMATION
COMPARATIVE EVALUATIONS
COMPUTERS
COUNTING TECHNIQUES
DEFECTS
DETECTION
ELECTRONIC CIRCUITS
FAILURE MODE ANALYSIS
FAULT TREE ANALYSIS
IMPLEMENTATION
INTEGRATED CIRCUITS
MANUFACTURING
MATHEMATICAL LOGIC
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
OPTIMIZATION
PLANNING
RELIABILITY
SEMICONDUCTOR DEVICES
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING
TRANSISTORS
360601* -- Other Materials-- Preparation & Manufacture
42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
99 GENERAL AND MISCELLANEOUS
990200 -- Mathematics & Computers
AUTOMATION
COMPARATIVE EVALUATIONS
COMPUTERS
COUNTING TECHNIQUES
DEFECTS
DETECTION
ELECTRONIC CIRCUITS
FAILURE MODE ANALYSIS
FAULT TREE ANALYSIS
IMPLEMENTATION
INTEGRATED CIRCUITS
MANUFACTURING
MATHEMATICAL LOGIC
MEASURING INSTRUMENTS
MICROELECTRONIC CIRCUITS
MICROPROCESSORS
OPTIMIZATION
PLANNING
RELIABILITY
SEMICONDUCTOR DEVICES
SYSTEM FAILURE ANALYSIS
SYSTEMS ANALYSIS
TESTING
TRANSISTORS