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Total-dose hardness assurance for space applications of commercial CMOS devices

Conference ·
OSTI ID:6038883

Lot acceptance tests are evaluated for nonhardened CMOS devices for low total-dose space applications. Examples are presented for cases in which gate- or field-oxide leakage dominates device response. 12 refs., 3 figs.

Research Organization:
Sandia National Labs., Albuquerque, NM (USA)
DOE Contract Number:
AC04-76DP00789
OSTI ID:
6038883
Report Number(s):
SAND-89-0181C; CONF-890723-2; ON: DE89006765
Country of Publication:
United States
Language:
English

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