Total-dose hardness assurance for space applications of commercial CMOS devices
Conference
·
OSTI ID:6038883
Lot acceptance tests are evaluated for nonhardened CMOS devices for low total-dose space applications. Examples are presented for cases in which gate- or field-oxide leakage dominates device response. 12 refs., 3 figs.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (USA)
- DOE Contract Number:
- AC04-76DP00789
- OSTI ID:
- 6038883
- Report Number(s):
- SAND-89-0181C; CONF-890723-2; ON: DE89006765
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
42 ENGINEERING
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
ALKALI METAL ISOTOPES
BETA DECAY RADIOISOTOPES
BETA-MINUS DECAY RADIOISOTOPES
CESIUM 137
CESIUM ISOTOPES
HARDENING
ISOTOPES
MOS TRANSISTORS
NUCLEI
ODD-EVEN NUCLEI
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIOISOTOPES
SEMICONDUCTOR DEVICES
TESTING
TRANSISTORS
YEARS LIVING RADIOISOTOPES
420800* -- Engineering-- Electronic Circuits & Devices-- (-1989)
ALKALI METAL ISOTOPES
BETA DECAY RADIOISOTOPES
BETA-MINUS DECAY RADIOISOTOPES
CESIUM 137
CESIUM ISOTOPES
HARDENING
ISOTOPES
MOS TRANSISTORS
NUCLEI
ODD-EVEN NUCLEI
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIOISOTOPES
SEMICONDUCTOR DEVICES
TESTING
TRANSISTORS
YEARS LIVING RADIOISOTOPES