Hardness assurance for low-dose space applications

Conference · Sat Nov 30 23:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.124145· OSTI ID:5825874

Fleetwood, D M; Winokur, P S; Meisenheimer, T L ^[1]

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1. Sandia National Labs., Albuquerque, NM (United States)

This paper presents a method to conservatively estimate MOS hardness in space that shares the same technical basis as MIL-STD 883C, Test Method 1019.4, but permits greater latitude in part selection for low-dose space systems. Cobalt-60 irradiation at 50-300 rad(Si)/s followed by 25{degrees} C anneal is shown to provide an effective test of oxide-charge related failures at low dose rates that is considerably less conservative than Method 1019.4. For MOS devices with gate oxides thinner than 100 nm, the authors show that an elevated temperature rebound test generally is not required for systems with total dose requirements less than 5 krad(Si). For thicker gate oxides and/or higher-dose system requirements, rebound testing per Method 1019.4 generally is required to ensure that devices do not fail in space due to interface-trap effects.

• DOE Contract Number: AC04-76DP00789
• OSTI ID: 5825874
• Report Number(s): CONF-910751--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:6; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
661320 -- Auroral
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
ANNEALING
BETA DECAY RADIOISOTOPES
BETA-MINUS DECAY RADIOISOTOPES
CHALCOGENIDES
COBALT 60
COBALT ISOTOPES
DOSE RATES
FAILURES
HARDENING
HEAT TREATMENTS
INTERFACES
INTERMEDIATE MASS NUCLEI
INTERNAL CONVERSION RADIOISOTOPES
ISOMERIC TRANSITION ISOTOPES
ISOTOPES
MINUTES LIVING RADIOISOTOPES
MOS TRANSISTORS
NUCLEI
ODD-ODD NUCLEI
OXIDES
OXYGEN COMPOUNDS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
RADIATION HARDENING
RADIOISOTOPES
SEMICONDUCTOR DEVICES
SPACE
TEMPERATURE RANGE
TEMPERATURE RANGE 0273-0400 K
TESTING
TRANSISTORS
TRAPS
USES
YEARS LIVING RADIOISOT