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Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates

Journal Article · · IEEE Transactions on Nuclear Science
 [1];  [2];  [3];  [4]
  1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  2. Swift Engineering and Radiation Services LLC, San Jose, CA (United States)
  3. Brigham Young Univ., Provo, UT (United States). Center for High Performance Reconfigurable Computing
  4. Univ. of Southern California, Los Angeles, CA (United States). Information Science Inst.
+ Show Author Affiliations
Our study describes complications introduced by angular direct ionization events on space error rate predictions. In particular, prevalence of multiple-cell upsets and a breakdown in the application of effective linear energy transfer in modern-scale devices can skew error rates approximated from currently available estimation models. Moreover, this paper highlights the importance of angular testing and proposes a methodology to extend existing error estimation tools to properly consider angular strikes in modern-scale devices. Finally, these techniques are illustrated with test data provided from a modern 28 nm SRAM-based device.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1338386
Alternate ID(s):
OSTI ID: 1530963
Report Number(s):
SAND2015--5557C; SAND2016--12547J; 649868
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6 Vol. 62; ISSN 0018-9499
Publisher:
Institute of Electrical and Electronics Engineers (IEEE)Copyright Statement
Country of Publication:
United States
Language:
English

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Related Subjects

42 ENGINEERING
97 MATHEMATICS AND COMPUTING
multiple bit upset
multiple cell upset
radiation effects
single event effects