Detection of configuration memory upsets causing persistent errors in SRAM-based FPGAs.
Conference
·
OSTI ID:977896
- Michael J.
- Michael Paul
- Paul S.
FPGA designers are becoming increasingly aware of fault tolerance issues in modern FPGA designs, especially designs destined for a radiation environment. We classify errors due to upsets within the configuration bitstream into two categories; namely, persistent and non-persistent. Persistent errors generally cannot be tolerated. However, non-persistent errors can be tolerated in certain types of designs as long as they are properly accounted for. We discuss situations in which nonpersistent errors are acceptable, and describe a technique for the detection of upsets causing persistent errors within the configuration memory of an SRAM-based FPGA.
- Research Organization:
- Los Alamos National Laboratory
- Sponsoring Organization:
- DOE
- OSTI ID:
- 977896
- Report Number(s):
- LA-UR-04-7085
- Country of Publication:
- United States
- Language:
- English
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