Addressing Angular Single-Event Effects in the Estimation of On-Orbit Error Rates

Journal Article · Tue Dec 01 00:00:00 EST 2015 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/TNS.2015.2498641· OSTI ID:1338386

Lee, David S. ^[1]; Swift, Gary M. ^[2]; Wirthlin, Michael J. ^[3]; Draper, Jeffrey ^[4]

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1. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
2. Swift Engineering and Radiation Services LLC, San Jose, CA (United States)
3. Brigham Young Univ., Provo, UT (United States). Center for High Performance Reconfigurable Computing
4. Univ. of Southern California, Los Angeles, CA (United States). Information Science Inst.

Our study describes complications introduced by angular direct ionization events on space error rate predictions. In particular, prevalence of multiple-cell upsets and a breakdown in the application of effective linear energy transfer in modern-scale devices can skew error rates approximated from currently available estimation models. Moreover, this paper highlights the importance of angular testing and proposes a methodology to extend existing error estimation tools to properly consider angular strikes in modern-scale devices. Finally, these techniques are illustrated with test data provided from a modern 28 nm SRAM-based device.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• Grant/Contract Number: AC04-94AL85000
• OSTI ID: 1338386
• Report Number(s): SAND2016-12547J; SAND2015-5557C; 649868
• Journal Information: IEEE Transactions on Nuclear Science, Vol. 62, Issue 6; ISSN 0018-9499
• Publisher: Institute of Electrical and Electronics Engineers (IEEE)
• Country of Publication: United States
• Language: English

Related Subjects

97 MATHEMATICS AND COMPUTING
42 ENGINEERING
multiple bit upset
multiple cell upset
radiation effects
single event effects