Role of burn-in during qualification testing
Conference
·
OSTI ID:10132434
Significantly different radiation responses have been observed for both transistors and ICs with and without preirradiation burn-in. The hardness assurance implications of these results and possible changes to the MIL-STDs will be presented.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States); Department of Defense, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 10132434
- Report Number(s):
- SAND--94-0448C; CONF-940726--8; ON: DE94007864; BR: GB0103012
- Country of Publication:
- United States
- Language:
- English
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