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Title: High numerical aperture ring field projection system for extreme ultraviolet lithography

Patent ·
OSTI ID:873554
 [1];  [2]
  1. 218 Eastridge Dr., San Ramon, CA 94583-4905
  2. 56 Drake La., Fairfield, CT 06430-2925

An all-reflective optical system for a projection photolithography camera has a source of EUV radiation, a wafer and a mask to be imaged on the wafer. The optical system includes a first convex mirror, a second mirror, a third convex mirror, a fourth concave mirror, a fifth convex mirror and a sixth concave mirror. The system is configured such that five of the six mirrors receive a chief ray at an incidence angle of less than substantially 9.degree., and each of the six mirrors receives a chief ray at an incidence angle of less than substantially 14.degree.. Four of the six reflecting surfaces have an aspheric departure of less than substantially 12 .mu.m. Five of the six reflecting surfaces have an aspheric departure of less than substantially 12 .mu.m. Each of the six reflecting surfaces has an aspheric departure of less than substantially 16 .mu.m.

Research Organization:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
DOE Contract Number:
W-7405-ENG-48
Assignee:
Hudyma, Russell (218 Eastridge Dr., San Ramon, CA 94583-4905);Shafer, David R. (56 Drake La., Fairfield, CT 06430-2925)
Patent Number(s):
US 6188513
OSTI ID:
873554
Country of Publication:
United States
Language:
English

References (4)

Design of reflective relay for soft x-ray lithography conference January 1991
Reflective systems design study for soft x-ray projection lithography journal November 1990
EUV optical design for a 100-nm CD imaging system
  • Sweeney, Donald W.; Hudyma, Russell M.; Chapman, Henry N.
  • 23rd Annual International Symposium on Microlithography, SPIE Proceedings https://doi.org/10.1117/12.309559
conference June 1998
Optical system design issues in development of projection camera for EUV lithography conference May 1995