Beam test results of the BTeV silicon pixel detector
Conference
·
OSTI ID:764081
The authors have described the results of the BTeV silicon pixel detector beam test. The pixel detectors under test used samples of the first two generations of Fermilab pixel readout chips, FPIX0 and FPIX1, (indium bump-bonded to ATLAS sensor prototypes). The spatial resolution achieved using analog charge information is excellent for a large range of track inclination. The resolution is still very good using only 2-bit charge information. A relatively small dependence of the resolution on bias voltage is observed. The resolution is observed to depend dramatically on the discriminator threshold, and it deteriorates rapidly for threshold above 4000e{sup {minus}}.
- Research Organization:
- Fermi National Accelerator Lab. (FNAL), Batavia, IL (United States)
- Sponsoring Organization:
- USDOE Office of Energy Research (ER) (US)
- DOE Contract Number:
- AC02-76CH03000
- OSTI ID:
- 764081
- Report Number(s):
- FERMILAB-Conf-00/219-E; TRN: US0004919
- Resource Relation:
- Conference: Pixel 2000, Genova (IT), 06/05/2000--06/08/2000; Other Information: PBD: 28 Sep 2000
- Country of Publication:
- United States
- Language:
- English
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