Wide band gap semiconductor NAND based neutron detection systems and methods
Patent
·
OSTI ID:1998440
A wide band gap semiconductor NAND based neutron detection system includes a semiconductor layer comprising a wide band gap material with a neutron absorber material in the wide band gap material, and the semiconductor layer is the only layer of the wide band gap semiconductor NAND based neutron detection system fabricated with the neutron absorber material.
- Research Organization:
- Oak Ridge Y-12 Plant (Y-12), Oak Ridge, TN (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- NA0001942
- Assignee:
- Consolidated Nuclear Security, LLC (Oak Ridge, TN)
- Patent Number(s):
- 11,668,845
- Application Number:
- 17/370,366
- OSTI ID:
- 1998440
- Resource Relation:
- Patent File Date: 07/08/2021
- Country of Publication:
- United States
- Language:
- English
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