A peak position comparison method for high-speed quantitative Laue microdiffraction data processing

Journal Article · Wed Sep 12 00:00:00 EDT 2018 · Scripta Materialia

DOI:https://doi.org/10.1016/j.scriptamat.2017.09.005· OSTI ID:1419469

Kou, Jiawei ^[1]; Chen, Kai  ^[1]; Tamura, Nobumichi ^[2]

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1. Xi'an Jiaotong Univ., Shaanxi (China). Center for Advancing Materials Performance from the Nanoscale (CAMP-Nano), State Key Lab. for Mechanical Behavior of Materials
2. Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Indexing Laue patterns of a synchrotron microdiffraction scan can take as much as ten times longer than collecting the data, impeding efficient structural analysis using this technique. Here in this paper, a novel strategy is developed. By comparing the peak positions of adjacent Laue patterns and checking the intensity sequence, grain and phase boundaries are identified, requiring only a limited number of indexing steps for each individual grain. Using this protocol, the Laue patterns can be indexed on the fly as they are taken. The validation of this method is demonstrated by analyzing the microstructure of a laser 3D printed multi-phase/multi-grain Ni-based superalloy.

• Research Organization: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
• Sponsoring Organization: USDOE Office of Science (SC), Basic Energy Sciences (BES)
• Grant/Contract Number: AC02-05CH11231
• OSTI ID: 1419469
• Alternate ID(s): OSTI ID: 1549939
• Journal Information: Scripta Materialia, Vol. 143, Issue C; ISSN 1359-6462
• Publisher: Elsevier
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
Polychromatic X-ray Laue microdiffraction
Orientation mapping
Phase distribution
Plastic deformation