Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Zhou, Guangni; Kou, Jiawei; Li, Yao; Zhu, Wenxin; Chen, Kai; Tamura, Nobumichi

doi:10.3390/qubs2020013

Title: Quantitative Scanning Laue Diffraction Microscopy: Application to the Study of 3D Printed Nickel-Based Superalloys

Journal Article · Tue Jun 05 00:00:00 EDT 2018 · Quantum Beam Science

DOI:https://doi.org/10.3390/qubs2020013· OSTI ID:1580426

Zhou, Guangni ^[1]; Kou, Jiawei ^[1]; Li, Yao ^[1]; Zhu, Wenxin ^[1];

^[1];

^[2]

Xi’an Jiaotong Univ. (China)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source (ALS)

Progress in computing speed and algorithm efficiency together with advances in area detector and X-ray optics technologies have transformed the technique of synchrotron radiation-based scanning Laue X-ray microdiffraction. It has now evolved into a near real-time quantitative imaging tool for material structure and deformation at the micrometer and nanometer scales. We will review the achievements of this technique at the Advanced Light Source (Berkeley, CA, USA), and demonstrate its application in the thorough microstructural investigations of laser-assisted 3D printed nickel-based superalloys.

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Research Organization:: Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1580426

Journal Information:: Quantum Beam Science, Vol. 2, Issue 2; ISSN 2412-382X

Publisher:: MDPICopyright Statement

Country of Publication:: United States

Language:: English

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