Real-time microstructure imaging by Laue microdiffraction: A sample application in laser 3D printed Ni-based superalloys

Zhou, Guangni; Zhu, Wenxin; Shen, Hao; Li, Yao; Zhang, Anfeng; Tamura, Nobumichi; Chen, Kai

doi:10.1038/srep28144

Real-time microstructure imaging by Laue microdiffraction: A sample application in laser 3D printed Ni-based superalloys

Journal Article · Wed Jun 15 00:00:00 EDT 2016 · Scientific Reports

DOI:https://doi.org/10.1038/srep28144· OSTI ID:1379400

Zhou, Guangni ^[1]; Zhu, Wenxin ^[1]; Shen, Hao ^[1]; Li, Yao ^[1]; Zhang, Anfeng ^[2]; Tamura, Nobumichi ^[3]; Chen, Kai ^[1]

Xi'an Jiaotong Univ (China). Center for Advanced Materials Performance from the Nanoscale (CAMP-Nano)
Xi'an Jiaotong Univ. (China). State Key Lab. for Manufacturing Systems Engineering
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States). Advanced Light Source

Synchrotron-based Laue microdiffraction has been widely applied to characterize the local crystal structure, orientation, and defects of inhomogeneous polycrystalline solids by raster scanning them under a micro/nano focused polychromatic X-ray probe. In a typical experiment, a large number of Laue diffraction patterns are collected, requiring novel data reduction and analysis approaches, especially for researchers who do not have access to fast parallel computing capabilities. In this article, a novel approach is developed by plotting the distributions of the average recorded intensity and the average filtered intensity of the Laue patterns. Visualization of the characteristic microstructural features is realized in real time during data collection. As an example, this method is applied to image key features such as microcracks, carbides, heat affected zone, and dendrites in a laser assisted 3D printed Ni-based superalloy, at a speed much faster than data collection. Such analytical approach remains valid for a wide range of crystalline solids, and therefore extends the application range of the Laue microdiffraction technique to problems where real-time decision-making during experiment is crucial (for instance time-resolved non-reversible experiments).

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES) (SC-22)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1379400

Journal Information:: Scientific Reports, Journal Name: Scientific Reports Journal Issue: 1 Vol. 6; ISSN 2045-2322

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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Probing Phase Transformations and Microstructural Evolutions at the Small Scales: Synchrotron X-ray Microdiffraction for Advanced Applications in 3D IC (Integrated Circuits) and Solar PV (Photovoltaic) Devices Radchenko, I.; Tippabhotla, S. K.; Tamura, N. Journal of Electronic Materials, Vol. 45, Issue 12 https://doi.org/10.1007/s11664-016-5012-5	journal	October 2016
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