Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain

Lee, Hyeon Jun; Guo, Er-Jia; Kwak, Jeong Hun; Hwang, Seung Hyun; Dörr, Kathrin; Lee, Jun Hee; Young Jo, Ji

doi:10.1063/1.4974450

Title: Controllable piezoelectricity of Pb(Zr_0.2Ti_0.8)O₃ film via in situ misfit strain

Journal Article · Wed Jan 18 00:00:00 EST 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4974450· OSTI ID:1340448

Lee, Hyeon Jun ^[1]; Guo, Er-Jia ^[2]; Kwak, Jeong Hun ^[1]; Hwang, Seung Hyun ^[1]; Dörr, Kathrin ^[3]; Lee, Jun Hee ^[4]; Young Jo, Ji ^[1]

Gwangju Inst. of Science and Technology (Korea, Republic of). School of Materials Science and Engineering
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Quantum Condensed Matter Division
Martin Luther Univ. of Halle-Wittenberg, Halle (Germany). Inst. for Physics
Ulsan Inst. of Science and Technology (Korea, Republic of). School of Energy and Chemical Engineering

In this paper, the tetragonality (c/a) of a PbZr_0.2Ti_0.8O₃ (PZT) thin film on La_0.7Sr_0.3MnO₃/0.72Pb(Mg_1/3Nb_2/3)O₃-0.28PbTiO₃ (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d₃₃) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d₃₃, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.

View Accepted Manuscript (DOE)

View Accepted Manuscript (Publisher)

Cite

Export

Save

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States); Gwangju Inst. of Science and Technology (Korea, Republic of); Martin Luther Univ. of Halle-Wittenberg, Halle (Germany)

Sponsoring Organization:: USDOE Laboratory Directed Research and Development (LDRD) Program; National Research Foundation of Korea (NRF); Gwangju Inst. of Science and Technology (Korea, Republic of); POSCO TJ Park Foundation (Korea, Republic of); German Research Foundation (DFG)

Contributing Organization:: Ulsan Inst. of Science and Technology (Korea, Republic of)

Grant/Contract Number:: AC05-00OR22725; NRF-2014R1A1A3053111; SFB 762

OSTI ID:: 1340448

Alternate ID(s):: OSTI ID: 1985556

Journal Information:: Applied Physics Letters, Vol. 110, Issue 3; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

Citation Metrics:

Cited by: 5 works

Citation information provided by
Web of Science

References (27)

Strain-controlled switching kinetics of epitaxial PbZr _0.52 Ti _0.48 O ₃ films Herklotz, A.; Guo, E-J; Biegalski, M. D. New Journal of Physics, Vol. 15, Issue 7 https://doi.org/10.1088/1367-2630/15/7/073021	journal	July 2013
Modulation of metal-insulator transitions by field-controlled strain in NdNiO3/SrTiO3/PMN-PT (001) heterostructures Heo, Seungyang; Oh, Chadol; Eom, Man Jin Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep22228	journal	February 2016
Quantification of strain and charge co-mediated magnetoelectric coupling on ultra-thin Permalloy/PMN-PT interface Nan, Tianxiang; Zhou, Ziyao; Liu, Ming Scientific Reports, Vol. 4, Issue 1 https://doi.org/10.1038/srep03688	journal	January 2014
Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films Pertsev, N. A.; Zembilgotov, A. G.; Tagantsev, A. K. Physical Review Letters, Vol. 80, Issue 9 https://doi.org/10.1103/PhysRevLett.80.1988	journal	March 1998
Neutron Diffraction Studies of Pb(Zr _x Ti _{1- x} )O ₃ Ceramics Frantti, Johannes; Lappalainen, Jyrki; Eriksson, Sten Japanese Journal of Applied Physics, Vol. 39, Issue Part 1, No. 9B https://doi.org/10.1143/JJAP.39.5697	journal	September 2000
Strain gradients in epitaxial ferroelectrics Catalan, G.; Noheda, B.; McAneney, J. Physical Review B, Vol. 72, Issue 2 https://doi.org/10.1103/PhysRevB.72.020102	journal	July 2005
Experimental investigation into the effect of substrate clamping on the piezoelectric behaviour of thick-film PZT elements Torah, R. N.; Beeby, S. P.; White, N. M. Journal of Physics D: Applied Physics, Vol. 37, Issue 7 https://doi.org/10.1088/0022-3727/37/7/019	journal	March 2004
Scaling of structure and electrical properties in ultrathin epitaxial ferroelectric heterostructures Nagarajan, V.; Junquera, J.; He, J. Q. Journal of Applied Physics, Vol. 100, Issue 5 https://doi.org/10.1063/1.2337363	journal	September 2006
Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics Ederer, Claude; Spaldin, Nicola A. Physical Review Letters, Vol. 95, Issue 25 https://doi.org/10.1103/PhysRevLett.95.257601	journal	December 2005
Intrinsic Nonstoichiometry in Single-Phase Pb(Zr0.5Ti0.5)O3 Holman, R. L.; Fulrath, R. M. Journal of the American Ceramic Society, Vol. 55, Issue 4 https://doi.org/10.1111/j.1151-2916.1972.tb11256.x	journal	April 1972
Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films Vrejoiu, I.; Le Rhun, G.; Pintilie, L. Advanced Materials, Vol. 18, Issue 13 https://doi.org/10.1002/adma.200502711	journal	July 2006
Structural visualization of polarization fatigue in epitaxial ferroelectric oxide devices Do, Dal-Hyun; Evans, Paul G.; Isaacs, Eric D. Nature Materials, Vol. 3, Issue 6 https://doi.org/10.1038/nmat1122	journal	May 2004
Nonlinear Piezoelectricity in Epitaxial Ferroelectrics at High Electric Fields Grigoriev, Alexei; Sichel, Rebecca; Lee, Ho Nyung Physical Review Letters, Vol. 100, Issue 2 https://doi.org/10.1103/PhysRevLett.100.027604	journal	January 2008
Lead-free piezoceramics with giant strain in the system Bi0.5Na0.5TiO3–BaTiO3–K0.5Na0.5NbO3. I. Structure and room temperature properties Zhang, Shan-Tao; Kounga, Alain Brice; Aulbach, Emil Journal of Applied Physics, Vol. 103, Issue 3 https://doi.org/10.1063/1.2838472	journal	February 2008
Effect of annealing atmosphere on domain structures and electromechanical properties of Pb(Zn1/3Nb2/3)O3-based ceramics Fan, Huiqing; Park, Gun-Tae; Choi, Jong-Jin Applied Physics Letters, Vol. 79, Issue 11 https://doi.org/10.1063/1.1402653	journal	September 2001
Ferroelectric 180° Domain Wall Motion Controlled by Biaxial Strain Guo, Er-Jia; Roth, Robert; Herklotz, Andreas Advanced Materials, Vol. 27, Issue 9 https://doi.org/10.1002/adma.201405205	journal	January 2015
Strain-mediated electric-field control of exchange bias in a Co90Fe10/BiFeO3/SrRuO3/PMN-PT heterostructure Wu, S. Z.; Miao, J.; Xu, X. G. Scientific Reports, Vol. 5, Issue 1 https://doi.org/10.1038/srep08905	journal	March 2015
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates Kim, D. M.; Eom, C. B.; Nagarajan, V. Applied Physics Letters, Vol. 88, Issue 14 https://doi.org/10.1063/1.2185614	journal	April 2006
Thickness effect on the dielectric, ferroelectric, and piezoelectric properties of ferroelectric lead zirconate titanate thin films Pérez de la Cruz, J.; Joanni, E.; Vilarinho, P. M. Journal of Applied Physics, Vol. 108, Issue 11 https://doi.org/10.1063/1.3514170	journal	December 2010
Ferroelectricity and Tetragonality in Ultrathin ${P b T i O}_{3}$ Films Lichtensteiger, Céline; Triscone, Jean-Marc; Junquera, Javier Physical Review Letters, Vol. 94, Issue 4 https://doi.org/10.1103/PhysRevLett.94.047603	journal	February 2005
Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr _0.52 ,Ti _0.48 )O ₃ thin films Nguyen, Minh D.; Dekkers, Matthijn; Houwman, Evert Applied Physics Letters, Vol. 99, Issue 25 https://doi.org/10.1063/1.3669527	journal	December 2011
Unit-cell scale mapping of ferroelectricity and tetragonality in epitaxial ultrathin ferroelectric films Jia, Chun-Lin; Nagarajan, Valanoor; He, Jia-Qing Nature Materials, Vol. 6, Issue 1 https://doi.org/10.1038/nmat1808	journal	December 2006
Critical thickness for extrinsic contributions to the dielectric and piezoelectric response in lead zirconate titanate ultrathin films Bastani, Yaser; Schmitz-Kempen, Thorsten; Roelofs, Andreas Journal of Applied Physics, Vol. 109, Issue 1 https://doi.org/10.1063/1.3527970	journal	January 2011
Critical thickness for ferroelectricity in perovskite ultrathin films Junquera, Javier; Ghosez, Philippe Nature, Vol. 422, Issue 6931, p. 506-509 https://doi.org/10.1038/nature01501	journal	April 2003
Epitaxial BiFeO₃ Multiferroic Thin Film Heterostructures Wang, J.; Neaton, J. B.; Zheng, H. Science, Vol. 299, Issue 5613, p. 1719-1722 https://doi.org/10.1126/science.1080615	journal	March 2003
Phase diagrams and physical properties of single-domain epitaxial $Pb ({Zr}_{1 - x} {Ti}_{x}) O_{3}$ thin films Pertsev, N. A.; Kukhar, V. G.; Kohlstedt, H. Physical Review B, Vol. 67, Issue 5 https://doi.org/10.1103/PhysRevB.67.054107	journal	February 2003
Influence of piezoelectric strain on the Raman spectra of BiFeO ₃ films deposited on PMN-PT substrates Himcinschi, Cameliu; Guo, Er-Jia; Talkenberger, Andreas Applied Physics Letters, Vol. 108, Issue 4 https://doi.org/10.1063/1.4940973	journal	January 2016

Cited By (1)

Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O ₃ films under a temporal electric field at BL15XU, SPring-8 Seo, Okkyun; Kim, Jaemyung; Song, Chulho Review of Scientific Instruments, Vol. 90, Issue 9 https://doi.org/10.1063/1.5110337	journal	September 2019

Similar Records

Influence of piezoelectric strain on the Raman spectra of BiFeO₃ films deposited on PMN-PT substrates

Journal Article · Wed Jan 27 00:00:00 EST 2016 · Applied Physics Letters · OSTI ID:1340448

Himcinschi, Cameliu; Guo, Er -Jia; Talkenberger, Andreas; +2 more

Voltage controlled biaxial strain in VO{sub 2} films grown on 0.72Pb(Mg{sub 1∕3}Nb{sub 2∕3})-0.28PbTiO{sub 3} crystals and its effect on the transition temperature

Journal Article · Mon Sep 01 00:00:00 EDT 2014 · Applied Physics Letters · OSTI ID:1340448

Soni, R.; Kohlstedt, H.

Influence of piezoelectric strain on the Raman spectra of BiFeO{sub 3} films deposited on PMN-PT substrates

Journal Article · Mon Jan 25 00:00:00 EST 2016 · Applied Physics Letters · OSTI ID:1340448

Himcinschi, Cameliu; Talkenberger, Andreas; Kortus, Jens; +2 more

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
PZT films
piezoelectric fields
piezoelectric transducers
ferroelectric thin films
thin film structure

Title: Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain

Citation Formats

References (27)

Cited By (1)

Similar Records

Related Subjects

Title: Controllable piezoelectricity of Pb(Zr_0.2Ti_0.8)O₃ film via in situ misfit strain