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Voltage controlled biaxial strain in VO{sub 2} films grown on 0.72Pb(Mg{sub 1∕3}Nb{sub 2∕3})-0.28PbTiO{sub 3} crystals and its effect on the transition temperature

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4894536· OSTI ID:22311352
;  [1]
  1. Nanoelektronik, Technische Fakultät, Christian-Albrechts-Universität zu Kiel, Kiel 24143 (Germany)

Vanadium oxide thin films (VO{sub 2}) were deposited on 0.72Pb(Mg{sub 1∕3}Nb{sub 2∕3})-0.28PbTiO{sub 3} (PMN-PT) crystalline substrates using pulsed laser deposition method. Due to their huge piezoelectric coefficients in the order of 2500 pm/V, the PMN-PT substrates are used to impose additional amount of biaxial strain to the VO{sub 2} films by applying an external bias to the substrates. The influence of the biaxial strain on the transition temperature and on the conductive properties of the VO{sub 2} films is investigated in this work. Thus, a change in the biaxial strain of −0.8 × 10{sup −3} applied in the (110) plane of the rutile cell of the VO{sub 2} lowered the metal-to-insulator transition temperature by 1.35 °C.

OSTI ID:
22311352
Journal Information:
Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 9 Vol. 105; ISSN APPLAB; ISSN 0003-6951
Country of Publication:
United States
Language:
English