Controllable piezoelectricity of Pb(Zr0.2Ti0.8)O3 film via in situ misfit strain

Lee, Hyeon Jun; Guo, Er-Jia; Kwak, Jeong Hun; Hwang, Seung Hyun; Dörr, Kathrin; Lee, Jun Hee; Young Jo, Ji

doi:10.1063/1.4974450

Controllable piezoelectricity of Pb(Zr_0.2Ti_0.8)O₃ film via in situ misfit strain

Journal Article · Tue Jan 17 23:00:00 EST 2017 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4974450· OSTI ID:1340448

Lee, Hyeon Jun ^[1]; Guo, Er-Jia ^[2]; Kwak, Jeong Hun ^[1]; Hwang, Seung Hyun ^[1]; Dörr, Kathrin ^[3]; Lee, Jun Hee ^[4]; Young Jo, Ji ^[1]

Gwangju Inst. of Science and Technology (Korea, Republic of). School of Materials Science and Engineering
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Quantum Condensed Matter Division
Martin Luther Univ. of Halle-Wittenberg, Halle (Germany). Inst. for Physics
Ulsan Inst. of Science and Technology (Korea, Republic of). School of Energy and Chemical Engineering

In this paper, the tetragonality (c/a) of a PbZr_0.2Ti_0.8O₃ (PZT) thin film on La_0.7Sr_0.3MnO₃/0.72Pb(Mg_1/3Nb_2/3)O₃-0.28PbTiO₃ (PMN-PT) substrates was controlled by applying an electric field on the PMN-PT substrate. The piezoelectric response of the PZT thin film under various biaxial strains was observed using time-resolved micro X-ray diffraction. The longitudinal piezoelectric coefficient (d₃₃) was reduced from 29.5 to 14.9 pm/V when the c/a ratio of the PZT film slightly changed from 1.051 to 1.056. Finally, our results demonstrate that the tetragonality of the PZT thin film plays a critical role in determining d₃₃, and in situ strain engineering using electromechanical substrate is useful in excluding the extrinsic effect resulting from the variation in the film thickness or the interface between substrate.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States); Gwangju Inst. of Science and Technology (Korea, Republic of); Martin Luther Univ. of Halle-Wittenberg, Halle (Germany)

Sponsoring Organization:: USDOE Laboratory Directed Research and Development (LDRD) Program; National Research Foundation of Korea (NRF) (Korea, Republic of); Gwangju Inst. of Science and Technology (Korea, Republic of); POSCO TJ Park Foundation (Korea, Republic of); Deutsche Forschungsgemeinschaft (DFG) (Germany)

Contributing Organization:: Ulsan Inst. of Science and Technology (Korea, Republic of)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1340448

Alternate ID(s):: OSTI ID: 1985556

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 3 Vol. 110; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

References (27)

Intrinsic Ferroelectric Properties of Strained Tetragonal PbZr0.2Ti0.8O3 Obtained on Layer–by–Layer Grown, Defect–Free Single–Crystalline Films Vrejoiu, I.; Le Rhun, G.; Pintilie, L. Advanced Materials, Vol. 18, Issue 13 https://doi.org/10.1002/adma.200502711	journal	July 2006
Ferroelectric 180° Domain Wall Motion Controlled by Biaxial Strain Guo, Er-Jia; Roth, Robert; Herklotz, Andreas Advanced Materials, Vol. 27, Issue 9 https://doi.org/10.1002/adma.201405205	journal	January 2015
Critical thickness for ferroelectricity in perovskite ultrathin films Junquera, Javier; Ghosez, Philippe Nature, Vol. 422, Issue 6931, p. 506-509 https://doi.org/10.1038/nature01501	journal	April 2003
Structural visualization of polarization fatigue in epitaxial ferroelectric oxide devices Do, Dal-Hyun; Evans, Paul G.; Isaacs, Eric D. Nature Materials, Vol. 3, Issue 6 https://doi.org/10.1038/nmat1122	journal	May 2004
Unit-cell scale mapping of ferroelectricity and tetragonality in epitaxial ultrathin ferroelectric films Jia, Chun-Lin; Nagarajan, Valanoor; He, Jia-Qing Nature Materials, Vol. 6, Issue 1 https://doi.org/10.1038/nmat1808	journal	December 2006
Quantification of strain and charge co-mediated magnetoelectric coupling on ultra-thin Permalloy/PMN-PT interface Nan, Tianxiang; Zhou, Ziyao; Liu, Ming Scientific Reports, Vol. 4, Issue 1 https://doi.org/10.1038/srep03688	journal	January 2014
Strain-mediated electric-field control of exchange bias in a Co90Fe10/BiFeO3/SrRuO3/PMN-PT heterostructure Wu, S. Z.; Miao, J.; Xu, X. G. Scientific Reports, Vol. 5, Issue 1 https://doi.org/10.1038/srep08905	journal	March 2015
Modulation of metal-insulator transitions by field-controlled strain in NdNiO3/SrTiO3/PMN-PT (001) heterostructures Heo, Seungyang; Oh, Chadol; Eom, Man Jin Scientific Reports, Vol. 6, Issue 1 https://doi.org/10.1038/srep22228	journal	February 2016
Effect of annealing atmosphere on domain structures and electromechanical properties of Pb(Zn1/3Nb2/3)O3-based ceramics Fan, Huiqing; Park, Gun-Tae; Choi, Jong-Jin Applied Physics Letters, Vol. 79, Issue 11 https://doi.org/10.1063/1.1402653	journal	September 2001
Thickness dependence of structural and piezoelectric properties of epitaxial Pb(Zr0.52Ti0.48)O3 films on Si and SrTiO3 substrates Kim, D. M.; Eom, C. B.; Nagarajan, V. Applied Physics Letters, Vol. 88, Issue 14 https://doi.org/10.1063/1.2185614	journal	April 2006
Scaling of structure and electrical properties in ultrathin epitaxial ferroelectric heterostructures Nagarajan, V.; Junquera, J.; He, J. Q. Journal of Applied Physics, Vol. 100, Issue 5 https://doi.org/10.1063/1.2337363	journal	September 2006
Lead-free piezoceramics with giant strain in the system Bi0.5Na0.5TiO3–BaTiO3–K0.5Na0.5NbO3. I. Structure and room temperature properties Zhang, Shan-Tao; Kounga, Alain Brice; Aulbach, Emil Journal of Applied Physics, Vol. 103, Issue 3 https://doi.org/10.1063/1.2838472	journal	February 2008
Thickness effect on the dielectric, ferroelectric, and piezoelectric properties of ferroelectric lead zirconate titanate thin films Pérez de la Cruz, J.; Joanni, E.; Vilarinho, P. M. Journal of Applied Physics, Vol. 108, Issue 11 https://doi.org/10.1063/1.3514170	journal	December 2010
Critical thickness for extrinsic contributions to the dielectric and piezoelectric response in lead zirconate titanate ultrathin films Bastani, Yaser; Schmitz-Kempen, Thorsten; Roelofs, Andreas Journal of Applied Physics, Vol. 109, Issue 1 https://doi.org/10.1063/1.3527970	journal	January 2011
Misfit strain dependence of ferroelectric and piezoelectric properties of clamped (001) epitaxial Pb(Zr _0.52 ,Ti _0.48 )O ₃ thin films Nguyen, Minh D.; Dekkers, Matthijn; Houwman, Evert Applied Physics Letters, Vol. 99, Issue 25 https://doi.org/10.1063/1.3669527	journal	December 2011
Influence of piezoelectric strain on the Raman spectra of BiFeO ₃ films deposited on PMN-PT substrates Himcinschi, Cameliu; Guo, Er-Jia; Talkenberger, Andreas Applied Physics Letters, Vol. 108, Issue 4 https://doi.org/10.1063/1.4940973	journal	January 2016
Experimental investigation into the effect of substrate clamping on the piezoelectric behaviour of thick-film PZT elements Torah, R. N.; Beeby, S. P.; White, N. M. Journal of Physics D: Applied Physics, Vol. 37, Issue 7 https://doi.org/10.1088/0022-3727/37/7/019	journal	March 2004
Strain-controlled switching kinetics of epitaxial PbZr _0.52 Ti _0.48 O ₃ films Herklotz, A.; Guo, E-J; Biegalski, M. D. New Journal of Physics, Vol. 15, Issue 7 https://doi.org/10.1088/1367-2630/15/7/073021	journal	July 2013
Phase diagrams and physical properties of single-domain epitaxial Pb ( Zr 1 − x Ti x ) O 3 thin films Pertsev, N. A.; Kukhar, V. G.; Kohlstedt, H. Physical Review B, Vol. 67, Issue 5 https://doi.org/10.1103/PhysRevB.67.054107	journal	February 2003
Strain gradients in epitaxial ferroelectrics Catalan, G.; Noheda, B.; McAneney, J. Physical Review B, Vol. 72, Issue 2 https://doi.org/10.1103/PhysRevB.72.020102	journal	July 2005
Nonlinear Piezoelectricity in Epitaxial Ferroelectrics at High Electric Fields Grigoriev, Alexei; Sichel, Rebecca; Lee, Ho Nyung Physical Review Letters, Vol. 100, Issue 2 https://doi.org/10.1103/PhysRevLett.100.027604	journal	January 2008
Effect of Mechanical Boundary Conditions on Phase Diagrams of Epitaxial Ferroelectric Thin Films Pertsev, N. A.; Zembilgotov, A. G.; Tagantsev, A. K. Physical Review Letters, Vol. 80, Issue 9 https://doi.org/10.1103/PhysRevLett.80.1988	journal	March 1998
Ferroelectricity and Tetragonality in Ultrathin P b T i O 3 Films Lichtensteiger, Céline; Triscone, Jean-Marc; Junquera, Javier Physical Review Letters, Vol. 94, Issue 4 https://doi.org/10.1103/PhysRevLett.94.047603	journal	February 2005
Effect of Epitaxial Strain on the Spontaneous Polarization of Thin Film Ferroelectrics Ederer, Claude; Spaldin, Nicola A. Physical Review Letters, Vol. 95, Issue 25 https://doi.org/10.1103/PhysRevLett.95.257601	journal	December 2005
Intrinsic Nonstoichiometry in Single-Phase Pb(Zr0.5Ti0.5)O3 Holman, R. L.; Fulrath, R. M. Journal of the American Ceramic Society, Vol. 55, Issue 4 https://doi.org/10.1111/j.1151-2916.1972.tb11256.x	journal	April 1972
Epitaxial BiFeO₃ Multiferroic Thin Film Heterostructures Wang, J.; Neaton, J. B.; Zheng, H. Science, Vol. 299, Issue 5613, p. 1719-1722 https://doi.org/10.1126/science.1080615	journal	March 2003
Neutron Diffraction Studies of Pb(Zr _x Ti _{1- x} )O ₃ Ceramics Frantti, Johannes; Lappalainen, Jyrki; Eriksson, Sten Japanese Journal of Applied Physics, Vol. 39, Issue Part 1, No. 9B https://doi.org/10.1143/JJAP.39.5697	journal	September 2000

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Time-resolved X-ray diffraction system for study of Pb(Zr, Ti)O ₃ films under a temporal electric field at BL15XU, SPring-8 Seo, Okkyun; Kim, Jaemyung; Song, Chulho Review of Scientific Instruments, Vol. 90, Issue 9 https://doi.org/10.1063/1.5110337	journal	September 2019

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Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
PZT films
ferroelectric thin films
piezoelectric fields
piezoelectric transducers
thin film structure