Influence of piezoelectric strain on the Raman spectra of BiFeO3 films deposited on PMN-PT substrates

Himcinschi, Cameliu; Guo, Er -Jia; Talkenberger, Andreas; Dorr, Kathrin; Kortus, Jens

doi:10.1063/1.4940973

Influence of piezoelectric strain on the Raman spectra of BiFeO₃ films deposited on PMN-PT substrates

Journal Article · Wed Jan 27 00:00:00 EST 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4940973· OSTI ID:1238753

Himcinschi, Cameliu ^[1]; Guo, Er -Jia ^[2]; Talkenberger, Andreas ^[1]; Dorr, Kathrin ^[3]; Kortus, Jens ^[1]

TU Bergakademie Freiberg, Freiberg (Germany)
Martin-Luther-Univ., Halle (Germany); Institute for Metallic Materials, Dresden (Germany); Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Martin-Luther-Univ., Halle (Germany); Institute for Metallic Materials, Dresden (Germany)

In this study, BiFeO₃ epitaxial thin films were deposited on piezoelectric 0.72Pb(Mg_1/3Nb_2/3)O₃-0.28PbTiO₃ (PMN-PT) substrates with a conductive buffer layer (La_0.7Sr_0.3MnO₃ or SrRuO₃) using pulsed laser deposition. The calibration of the strain values induced by the electric field applied on the piezoelectric PMN-PT substrates was realised using X-Ray diffraction measurements. The method of piezoelectrically induced strain allows to obtain a quantitative correlation between strain and the shift of the Raman-active phonons, ruling out the influence of extrinsic factors, such as growth conditions, crystalline quality of substrates, or film thickness. Using the Poisson number for BiFeO₃ one can determine the volume change induced by strain, and therefore the Gr neisen parameters for specific phonon modes.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1238753

Alternate ID(s):: OSTI ID: 22492703

Journal Information:: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 4 Vol. 108; ISSN APPLAB; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Ferroelastic domain identification in BiFeO3 crystals using Raman spectroscopy Himcinschi, Cameliu; Rix, Jan; Röder, Christian Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-018-36462-5	journal	January 2019

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Related Subjects

36 MATERIALS SCIENCE
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
buffer layers
epitaxy
phonons
piezoelectric fields
thin film structure