Accurate thickness/density measurements of organic light-emitting diodes
- Department of Physics and Astronomy, Vanderbilt University, Nashville, Tennessee 37235 (United States)
- Photonics Group, Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
We report on the use of Rutherford backscattering spectroscopy for thickness analysis of organic light-emitting diode structures (OLEDs) with subnanometer resolution and a spatial resolution {lt}1thinspmm. A careful study of ion beam induced effects revealed some organic film degradation, but not so severe as to inhibit meaningful measurements. The method is independent of the substrate and is still applicable if the organic film is capped with a metal cathode. Common OLED materials have been the subject of this study: poly(2-methoxy,5-(2{sup {prime}}-ethylhexoxy)-1,4-phenylene-vinylene) (MEH-PPV), N{sup {prime}},N{sup {prime}}-diphenyl-N, N{sup {prime}}-bis(3-methylphenyl)-1,1{sup {prime}} biphenyl-4,4{sup {prime}}-diamine (TPD), and tris-(8-hydroxyquinoline) aluminum (Alq{sub 3}). The densities of thin films of evaporated TPD ({rho}=1.22{plus_minus}0.05thinspg/cm{sup 3}) and Alq{sub 3} ({rho}=1.51{plus_minus}0.03thinspg/cm{sup 3}) have been established. {copyright} {ital 1998 American Institute of Physics.}
- OSTI ID:
- 663087
- Journal Information:
- Journal of Applied Physics, Vol. 84, Issue 7; Other Information: PBD: Oct 1998
- Country of Publication:
- United States
- Language:
- English
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