X-ray photoemission and photoabsorption of organic electroluminescent materials
- Department of Physics, University of Wisconsin-Madison, Madison, Wisconsin 53706-1390 (United States)
- Lawrence Livermore National Laboratory, Livermore, California 94551 (United States)
- Advanced Light Source, Lawrence Berkeley National Laboratory, Berkeley, California 94720 (United States)
Thin films of tris-(8, hydroxyquinoline) aluminum (Alq{sub 3}) and N,N{sup {prime}}-diphenyl-N,N{sup {prime}}-bis(3-methylphenyl)-1,1{sup {prime}}-biphenyl-4,4{sup {prime}}-diamine (TPD) were measured using synchrotron radiation-based core and valence level photoemission and core level photoabsorption to elucidate the element-specific electronic structure of organic electroluminescent materials. The energy level alignment of an Alq{sub 3}/TPD interface is given for both occupied and unoccupied states. A comparison of freshly evaporated films of Alq{sub 3} and TPD with films that have been exposed to intense radiation or oxidative conditions sheds light on possible damage mechanisms of the molecular solid. {copyright} {ital 1999 American Institute of Physics.} thinsp
- OSTI ID:
- 349338
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 1 Vol. 86; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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