Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE
Abstract
Here we report ultra-high responsivity of epitaxial (SnxGa1–x)2O3 (TGO) Schottky UV-C photodetectors and experimentally identified the source of gain as deep-level defects, supported by first principles calculations. Epitaxial TGO films were grown by plasma-assisted molecular beam epitaxy on (–201) oriented n-type β-Ga2O3 substrates. Fabricated vertical Schottky devices exhibited peak responsivities as high as 3.5 ×104 A/W at –5 V applied bias under 250 nm illumination with sharp cutoff shorter than 280 nm and fast rise/fall time in milliseconds order. Hyperspectral imaging cathodoluminescence (CL) spectra were examined to find the mid-bandgap defects, the source of this high gain. Irrespective of different tin mole fractions, the TGO epilayer exhibited extra CL peaks at the green band (~2.20 eV) not seen in β-Ga2O3 along with enhancement of the blue emission-band (~2.64 eV) and suppression of the UV emission-band. Based on hybrid functional calculations of the optical emission expected for defects involving Sn in β-Ga2O3, VGa–Sn complexes are proposed as potential defect origins of the observed green and blue emission-bands. Such complexes behave as acceptors that can efficiently trap photogenerated holes and are predicted to be predominantly responsible for the ultra-high photoconductive gain in the Sn-alloyed Ga2O3 devices by means of thermionic emission andmore »
- Authors:
-
- Univ. of Central Florida, Orlando, FL (United States). College of Optics and Photonics, Center for Research and Education in Optics and Lasers (CREOL)
- Şırnak University (Turkey)
- Univ. of Oslo (Norway)
- Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
- Univ. of Strathclyde, Glasgow, Scotland (United Kingdom)
- Cardiff Univ., Wales (United Kingdom)
- Univ. of California, Santa Barbara, CA (United States)
- Univ. of Central Florida, Orlando, FL (United States). College of Optics and Photonics, Center for Research and Education in Optics and Lasers (CREOL); Univ. of Central Florida, Orlando, FL (United States)
- Publication Date:
- Research Org.:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Org.:
- USDOE National Nuclear Security Administration (NNSA); US Army Research Office (ARO); USDOE Laboratory Directed Research and Development (LDRD) Program; Research Council of Norway
- OSTI Identifier:
- 1959542
- Alternate Identifier(s):
- OSTI ID: 1887904
- Report Number(s):
- LLNL-JRNL-842526
Journal ID: ISSN 0003-6951; 1064852; TRN: US2313207
- Grant/Contract Number:
- AC52-07NA27344; 314017; 22-SI-003
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 121; Journal Issue: 11; Journal ID: ISSN 0003-6951
- Publisher:
- American Institute of Physics (AIP)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; hybrid density functional calculations; photodetectors; alloys; first-principle calculations; electron tunneling; epitaxy; cathodoluminescence spectroscopy; crystallographic defects; thermionic emission; photoconductive materials
Citation Formats
Mukhopadhyay, Partha, Hatipoglu, Isa, Frodason, Ymir K., Varley, Joel B., Williams, Martin S., Hunter, Daniel A., Gunasekar, Naresh K., Edwards, Paul R., Martin, Robert W., Wu, Feng, Mauze, Akhil, Speck, James S., and Schoenfeld, Winston V. Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE. United States: N. p., 2022.
Web. doi:10.1063/5.0107557.
Mukhopadhyay, Partha, Hatipoglu, Isa, Frodason, Ymir K., Varley, Joel B., Williams, Martin S., Hunter, Daniel A., Gunasekar, Naresh K., Edwards, Paul R., Martin, Robert W., Wu, Feng, Mauze, Akhil, Speck, James S., & Schoenfeld, Winston V. Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE. United States. https://doi.org/10.1063/5.0107557
Mukhopadhyay, Partha, Hatipoglu, Isa, Frodason, Ymir K., Varley, Joel B., Williams, Martin S., Hunter, Daniel A., Gunasekar, Naresh K., Edwards, Paul R., Martin, Robert W., Wu, Feng, Mauze, Akhil, Speck, James S., and Schoenfeld, Winston V. Fri .
"Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE". United States. https://doi.org/10.1063/5.0107557. https://www.osti.gov/servlets/purl/1959542.
@article{osti_1959542,
title = {Role of defects in ultra-high gain in fast planar tin gallium oxide UV-C photodetector by MBE},
author = {Mukhopadhyay, Partha and Hatipoglu, Isa and Frodason, Ymir K. and Varley, Joel B. and Williams, Martin S. and Hunter, Daniel A. and Gunasekar, Naresh K. and Edwards, Paul R. and Martin, Robert W. and Wu, Feng and Mauze, Akhil and Speck, James S. and Schoenfeld, Winston V.},
abstractNote = {Here we report ultra-high responsivity of epitaxial (SnxGa1–x)2O3 (TGO) Schottky UV-C photodetectors and experimentally identified the source of gain as deep-level defects, supported by first principles calculations. Epitaxial TGO films were grown by plasma-assisted molecular beam epitaxy on (–201) oriented n-type β-Ga2O3 substrates. Fabricated vertical Schottky devices exhibited peak responsivities as high as 3.5 ×104 A/W at –5 V applied bias under 250 nm illumination with sharp cutoff shorter than 280 nm and fast rise/fall time in milliseconds order. Hyperspectral imaging cathodoluminescence (CL) spectra were examined to find the mid-bandgap defects, the source of this high gain. Irrespective of different tin mole fractions, the TGO epilayer exhibited extra CL peaks at the green band (~2.20 eV) not seen in β-Ga2O3 along with enhancement of the blue emission-band (~2.64 eV) and suppression of the UV emission-band. Based on hybrid functional calculations of the optical emission expected for defects involving Sn in β-Ga2O3, VGa–Sn complexes are proposed as potential defect origins of the observed green and blue emission-bands. Such complexes behave as acceptors that can efficiently trap photogenerated holes and are predicted to be predominantly responsible for the ultra-high photoconductive gain in the Sn-alloyed Ga2O3 devices by means of thermionic emission and electron tunneling. Regenerating the VGa–Sn defect complexes by optimizing the growth techniques, we have demonstrated a planar Schottky UV-C photodetector of the highest peak responsivity.},
doi = {10.1063/5.0107557},
journal = {Applied Physics Letters},
number = 11,
volume = 121,
place = {United States},
year = {Fri Sep 16 00:00:00 EDT 2022},
month = {Fri Sep 16 00:00:00 EDT 2022}
}
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