X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

Liu, J. P.; Kirchhoff, J.; Zhou, L.; Zhao, M.; Grapes, M. D.; Dale, D. S.; Tate, M. D.; Philipp, H. T.; Gruner, S. M.; Weihs, T. P.; Hufnagel, T. C.

doi:10.1107/S1600577517008013

Title: X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

Abstract

A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s^-1 are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks, and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases.

Authors:

Liu, J. P. ^[1]; Kirchhoff, J. ^[2]; Zhou, L. ^[2]; Zhao, M. ^[2]; Grapes, M. D. ^[2]; Dale, D. S. ^[3]; Tate, M. D. ^[4]; Philipp, H. T. ^[4]; Gruner, S. M. ^[5]; Weihs, T. P. ^[2]; Hufnagel, T. C. ^[2]

Johns Hopkins Univ., Baltimore, MD (United States); Beijing Inst. of Technology, Beijing (China)
Johns Hopkins Univ., Baltimore, MD (United States)
Cornell Univ., Ithaca, NY (United States). Cornell High Energy Synchrotron Source (CHESS)
Cornell Univ., Ithaca, NY (United States)
Cornell Univ., Ithaca, NY (United States). Cornell High Energy Synchrotron Source (CHESS); Cornell Univ., Ithaca, NY (United States); Cornell Univ., Ithaca, NY (United States). Kavli Inst. at Cornell for Nanoscale Science

Publication Date:: Thu Jun 15 00:00:00 EDT 2017

Research Org.:: Johns Hopkins Univ., Baltimore, MD (United States)

Sponsoring Org.:: USDOE

OSTI Identifier:: 1426777

Grant/Contract Number:: SC0016035

Resource Type:: Accepted Manuscript

Journal Name:: Journal of Synchrotron Radiation (Online)

Additional Journal Information:: Journal Name: Journal of Synchrotron Radiation (Online); Journal Volume: 24; Journal Issue: 4; Journal ID: ISSN 1600-5775

Publisher:: International Union of Crystallography

Country of Publication:: United States

Language:: English

Subject:: 73 NUCLEAR PHYSICS AND RADIATION PHYSICS; X-ray reflectivity; multilayer; interdiffusion.

Citation Formats


                    Liu, J. P., Kirchhoff, J., Zhou, L., Zhao, M., Grapes, M. D., Dale, D. S., Tate, M. D., Philipp, H. T., Gruner, S. M., Weihs, T. P., and Hufnagel, T. C. X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating.  United States: N. p., 2017. 
Web.  doi:10.1107/S1600577517008013.

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                    Liu, J. P., Kirchhoff, J., Zhou, L., Zhao, M., Grapes, M. D., Dale, D. S., Tate, M. D., Philipp, H. T., Gruner, S. M., Weihs, T. P., & Hufnagel, T. C. X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating.  United States.  https://doi.org/10.1107/S1600577517008013

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                    Liu, J. P., Kirchhoff, J., Zhou, L., Zhao, M., Grapes, M. D., Dale, D. S., Tate, M. D., Philipp, H. T., Gruner, S. M., Weihs, T. P., and Hufnagel, T. C. Thu .  
"X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating".  United States.  https://doi.org/10.1107/S1600577517008013.  https://www.osti.gov/servlets/purl/1426777.

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@article{osti_1426777,

  title        = {X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating},

  author       = {Liu, J. P. and Kirchhoff, J. and Zhou, L. and Zhao, M. and Grapes, M. D. and Dale, D. S. and Tate, M. D. and Philipp, H. T. and Gruner, S. M. and Weihs, T. P. and Hufnagel, T. C.},

  abstractNote = {A technique for measuring interdiffusion in multilayer materials during rapid heating using X-ray reflectivity is described. In this technique the sample is bent to achieve a range of incident angles simultaneously, and the scattered intensity is recorded on a fast high-dynamic-range mixed-mode pixel array detector. Heating of the multilayer is achieved by electrical resistive heating of the silicon substrate, monitored by an infrared pyrometer. As an example, reflectivity data from Al/Ni heated at rates up to 200 K s-1 are presented. At short times the interdiffusion coefficient can be determined from the rate of decay of the reflectivity peaks, and it is shown that the activation energy for interdiffusion is consistent with a grain boundary diffusion mechanism. At longer times the simple analysis no longer applies because the evolution of the reflectivity pattern is complicated by other processes, such as nucleation and growth of intermetallic phases.},

  doi          = {10.1107/S1600577517008013},

  journal      = {Journal of Synchrotron Radiation (Online)},

  number       = 4,

  volume       = 24,

  place        = {United States},

  year         = {Thu Jun 15 00:00:00 EDT 2017},

  month        = {Thu Jun 15 00:00:00 EDT 2017}

}

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Works referencing / citing this record:

SHS in Ni/Al Nanofoils: A Review of Experiments and Molecular Dynamics Simulations
journal, April 2018

Baras, Florence; Turlo, Vladyslav; Politano, Olivier
Advanced Engineering Materials, Vol. 20, Issue 8
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Crystal reorientation in methylammonium lead iodide perovskite thin film with thermal annealing
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Thickness dependence of structural, optical and morphological properties of sol-gel derived TiO ₂ thin film
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Joress, H.; Brock, J. D.; Woll, A. R.
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Title: X-ray reflectivity measurement of interdiffusion in metallic multilayers during rapid heating

Abstract

Citation Formats

Correlations for diffusion constants journal, August 1980

Effect of Gradient Energy on Diffusion in Gold‐Silver Alloys journal, April 1969

Diffusion coefficients of some solutes in fcc and liquid Al: critical evaluation and correlation journal, December 2003

Intermetallic phase formation during annealing of Al/Ni multilayers journal, December 1994

Determination of diffusion coefficients of Zn, Co and Ni in aluminium by a resistometric method journal, November 1978

Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique journal, January 1995

Thresholds for igniting exothermic reactions in Al/Ni multilayers using pulses of electrical, mechanical, and thermal energy journal, January 2013

Effect of intermixing on self-propagating exothermic reactions in Al/Ni nanolaminate foils journal, February 2000

Measurements of atomic diffusion using metallic multilayers journal, January 1997

Diffusion in thin bilayer films during rapid thermal annealing: Diffusion in thin bilayer films journal, August 2014

Solid-State Kinetic Models: Basics and Mathematical Fundamentals journal, September 2006

Effect of varying bilayer spacing distribution on reaction heat and velocity in reactive Al/Ni multilayers journal, April 2009

High-speed x-ray reflectometory in multiwavelength-dispersive mode journal, January 2008

New apparatus for grazing X-ray reflectometry in the angle-resolved dispersive mode journal, October 1989

The energy-dispersive reflectometer/diffractometer at BESSY-I journal, January 1999

Diffusion Barriers in Semiconductor Contact Technology journal, January 1997

X-ray Reflectometer for the Diagnostics of Thin Films During Growth journal, December 1997

Interdiffusion in composition‐modulated copper‐gold thin films journal, June 1977

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1 0 ordering in 57 Fe/Pt multilayers journal, March 2009

Quick X-ray reflectivity of spherical samples journal, April 2013

A Medium-Format, Mixed-Mode Pixel Array Detector for Kilohertz X-ray Imaging journal, March 2013

Interdiffusion in nanometer-scale multilayers investigated by in situ low-angle x-ray diffraction journal, April 1999

Electron microscopy study of Ni/Ni3Al diffusion-couple interface—II. Diffusivity measurement journal, October 1994

SHS in Ni/Al Nanofoils: A Review of Experiments and Molecular Dynamics Simulations journal, April 2018

Crystal reorientation in methylammonium lead iodide perovskite thin film with thermal annealing journal, January 2019

Thickness dependence of structural, optical and morphological properties of sol-gel derived TiO 2 thin film journal, October 2018

Quick X-ray Reflectivity using Monochromatic Synchrotron Radiation for Time-Resolved Applications text, January 2017

Correlations for diffusion constants
journal, August 1980

Effect of Gradient Energy on Diffusion in Gold‐Silver Alloys
journal, April 1969

Diffusion coefficients of some solutes in fcc and liquid Al: critical evaluation and correlation
journal, December 2003

Intermetallic phase formation during annealing of Al/Ni multilayers
journal, December 1994

Determination of diffusion coefficients of Zn, Co and Ni in aluminium by a resistometric method
journal, November 1978

Real Time Measurement of Epilayer Strain Using a Simplified Wafer Curvature Technique
journal, January 1995

Thresholds for igniting exothermic reactions in Al/Ni multilayers using pulses of electrical, mechanical, and thermal energy
journal, January 2013

Effect of intermixing on self-propagating exothermic reactions in Al/Ni nanolaminate foils
journal, February 2000

Measurements of atomic diffusion using metallic multilayers
journal, January 1997

Diffusion in thin bilayer films during rapid thermal annealing: Diffusion in thin bilayer films
journal, August 2014

Solid-State Kinetic Models: Basics and Mathematical Fundamentals
journal, September 2006

Effect of varying bilayer spacing distribution on reaction heat and velocity in reactive Al/Ni multilayers
journal, April 2009

High-speed x-ray reflectometory in multiwavelength-dispersive mode
journal, January 2008

New apparatus for grazing X-ray reflectometry in the angle-resolved dispersive mode
journal, October 1989

The energy-dispersive reflectometer/diffractometer at BESSY-I
journal, January 1999

Diffusion Barriers in Semiconductor Contact Technology
journal, January 1997

X-ray Reflectometer for the Diagnostics of Thin Films During Growth
journal, December 1997

Interdiffusion in composition‐modulated copper‐gold thin films
journal, June 1977

In situ x-ray reflectivity and grazing incidence x-ray diffraction study of L 1 ₀ ordering in ⁵⁷ Fe/Pt multilayers
journal, March 2009

Quick X-ray reflectivity of spherical samples
journal, April 2013

A Medium-Format, Mixed-Mode Pixel Array Detector for Kilohertz X-ray Imaging
journal, March 2013

Interdiffusion in nanometer-scale multilayers investigated by in situ low-angle x-ray diffraction
journal, April 1999

Electron microscopy study of Ni/Ni3Al diffusion-couple interface—II. Diffusivity measurement
journal, October 1994

SHS in Ni/Al Nanofoils: A Review of Experiments and Molecular Dynamics Simulations
journal, April 2018

Crystal reorientation in methylammonium lead iodide perovskite thin film with thermal annealing
journal, January 2019

Thickness dependence of structural, optical and morphological properties of sol-gel derived TiO ₂ thin film
journal, October 2018

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