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Title: Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon

Abstract

Herein, we investigate the process–structure–properties relationships of in situ phosphorus (P)-doped polycrystalline silicon (poly-Si) films by atmospheric pressure chemical vapor deposition (APCVD) for fabricating poly-Si passivating, electron selective contacts. This high-throughput in-line APCVD technique enables to achieve a low-cost, simple manufacturing process for crystalline silicon (c-Si) solar cells featuring poly-Si passivating contact by excluding the need for vacuum/plasma environment, and additional post-deposition doping steps. A thin layer of this P-doped poly-Si is deposited on an ultrathin (1.5 nm) silicon oxide (SiO x) coated c-Si substrate to fabricate the passivating contact. This is followed by various post-deposition treatments, including a high-temperature annealing step and hydrogenation process. The poly-Si films are characterized to achieve a better understanding of the impacts of deposition process conditions and post-deposition treatments on the microstructure, electrical conductivity, passivation quality, and carrier selectivity of the contacts which assists to identify the optimal process conditions. In this work, the optimized annealing process with post-hydrogenation yields passivating contact with a saturation current density (J 0) of 3 fA cm–2 and an implied open-circuit voltage (iV OC) of 712 mV on planar c-Si wafer. Junction resistivity values ranging from 50 to 260 mΩ cm2 are realized for the poly-Si contacts processedmore » in the optimal annealing condition.« less

Authors:
ORCiD logo [1];  [1];  [1];  [2];  [2];  [3];  [3];  [1];  [1];  [1];  [1]; ORCiD logo [1]
  1. University of Central Florida, Orlando, FL (United States)
  2. Schmid Thermal Systems Inc., Watsonville, CA (United States)
  3. Schmid Group R&D, Freundenstadt (Germany)
Publication Date:
Research Org.:
Univ. of Central Florida, Orlando, FL (United States)
Sponsoring Org.:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
OSTI Identifier:
2212850
Grant/Contract Number:  
EE0008980
Resource Type:
Accepted Manuscript
Journal Name:
Physica Status Solidi. Rapid Research Letters
Additional Journal Information:
Journal Volume: 16; Journal Issue: 5; Journal ID: ISSN 1862-6254
Publisher:
Wiley
Country of Publication:
United States
Language:
English
Subject:
14 SOLAR ENERGY; passivating carrier selective contacts; APCVD; microstructure; polycrystalline silicon; solar cells; TOPCOn; POLO

Citation Formats

Mousumi, Jannatul Ferdous, Gregory, Geoffrey, Ganesan, Jeya Prakash, Nunez, Christian, Provancha, Kenneth, Seren, Sven, Zunft, Heiko, Jurca, Titel, Banerjee, Parag, Kar, Aravinda, Kumar, Ranganathan, and Davis, Kristopher O. Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon. United States: N. p., 2022. Web. doi:10.1002/pssr.202100639.
Mousumi, Jannatul Ferdous, Gregory, Geoffrey, Ganesan, Jeya Prakash, Nunez, Christian, Provancha, Kenneth, Seren, Sven, Zunft, Heiko, Jurca, Titel, Banerjee, Parag, Kar, Aravinda, Kumar, Ranganathan, & Davis, Kristopher O. Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon. United States. https://doi.org/10.1002/pssr.202100639
Mousumi, Jannatul Ferdous, Gregory, Geoffrey, Ganesan, Jeya Prakash, Nunez, Christian, Provancha, Kenneth, Seren, Sven, Zunft, Heiko, Jurca, Titel, Banerjee, Parag, Kar, Aravinda, Kumar, Ranganathan, and Davis, Kristopher O. Thu . "Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon". United States. https://doi.org/10.1002/pssr.202100639. https://www.osti.gov/servlets/purl/2212850.
@article{osti_2212850,
title = {Process–Structure–Properties Relationships of Passivating, Electron–Selective Contacts Formed by Atmospheric Pressure Chemical Vapor Deposition of Phosphorus–Doped Polysilicon},
author = {Mousumi, Jannatul Ferdous and Gregory, Geoffrey and Ganesan, Jeya Prakash and Nunez, Christian and Provancha, Kenneth and Seren, Sven and Zunft, Heiko and Jurca, Titel and Banerjee, Parag and Kar, Aravinda and Kumar, Ranganathan and Davis, Kristopher O.},
abstractNote = {Herein, we investigate the process–structure–properties relationships of in situ phosphorus (P)-doped polycrystalline silicon (poly-Si) films by atmospheric pressure chemical vapor deposition (APCVD) for fabricating poly-Si passivating, electron selective contacts. This high-throughput in-line APCVD technique enables to achieve a low-cost, simple manufacturing process for crystalline silicon (c-Si) solar cells featuring poly-Si passivating contact by excluding the need for vacuum/plasma environment, and additional post-deposition doping steps. A thin layer of this P-doped poly-Si is deposited on an ultrathin (1.5 nm) silicon oxide (SiO x) coated c-Si substrate to fabricate the passivating contact. This is followed by various post-deposition treatments, including a high-temperature annealing step and hydrogenation process. The poly-Si films are characterized to achieve a better understanding of the impacts of deposition process conditions and post-deposition treatments on the microstructure, electrical conductivity, passivation quality, and carrier selectivity of the contacts which assists to identify the optimal process conditions. In this work, the optimized annealing process with post-hydrogenation yields passivating contact with a saturation current density (J 0) of 3 fA cm–2 and an implied open-circuit voltage (iV OC) of 712 mV on planar c-Si wafer. Junction resistivity values ranging from 50 to 260 mΩ cm2 are realized for the poly-Si contacts processed in the optimal annealing condition.},
doi = {10.1002/pssr.202100639},
journal = {Physica Status Solidi. Rapid Research Letters},
number = 5,
volume = 16,
place = {United States},
year = {Thu Jan 27 00:00:00 EST 2022},
month = {Thu Jan 27 00:00:00 EST 2022}
}

Works referenced in this record:

Passivating contacts for crystalline silicon solar cells
journal, September 2019


Surface passivation of crystalline silicon solar cells: Present and future
journal, December 2018


High-Performance TiO 2 -Based Electron-Selective Contacts for Crystalline Silicon Solar Cells
journal, May 2016


Spatial Atomic Layer Deposition of Aluminum Oxide as a Passivating Hole Contact for Silicon Solar Cells
journal, August 2020

  • Öğütman, Kortan; Iqbal, Nafis; Gregory, Geoffrey
  • physica status solidi (a), Vol. 217, Issue 18
  • DOI: 10.1002/pssa.202000348

Improving the Passivation of Molybdenum Oxide Hole‐Selective Contacts with 1 nm Hydrogenated Aluminum Oxide Films for Silicon Solar Cells
journal, June 2020

  • Gregory, Geoffrey; Feit, Corbin; Gao, Zhengning
  • physica status solidi (a), Vol. 217, Issue 15
  • DOI: 10.1002/pssa.202000093

Thermally stable MoOx hole selective contact with Al2O3 interlayer for industrial size silicon solar cells
journal, September 2021

  • Ah Sen, Mike Tang Soo Kiong; Bronsveld, Paula; Weeber, Arthur
  • Solar Energy Materials and Solar Cells, Vol. 230
  • DOI: 10.1016/j.solmat.2021.111139

Silicon heterojunction solar cell with passivated hole selective MoO x contact
journal, March 2014

  • Battaglia, Corsin; de Nicolás, Silvia Martín; De Wolf, Stefaan
  • Applied Physics Letters, Vol. 104, Issue 11
  • DOI: 10.1063/1.4868880

Effective passivation of silicon surfaces by ultrathin atomic-layer deposited niobium oxide
journal, June 2018

  • Macco, B.; Bivour, M.; Deijkers, J. H.
  • Applied Physics Letters, Vol. 112, Issue 24
  • DOI: 10.1063/1.5029346

High-efficiency Silicon Heterojunction Solar Cells: A Review
journal, January 2012


Silicon heterojunction solar cells: Recent technological development and practical aspects - from lab to industry
journal, December 2018


Passivated rear contacts for high-efficiency n-type Si solar cells providing high interface passivation quality and excellent transport characteristics
journal, January 2014


The application of poly-Si/SiOx contacts as passivated top/rear contacts in Si solar cells
journal, January 2017


Approaching 23% with large‐area monoPoly cells using screen‐printed and fired rear passivating contacts fabricated by inline PECVD
journal, December 2018

  • Nandakumar, Naomi; Rodriguez, John; Kluge, Thomas
  • Progress in Photovoltaics: Research and Applications
  • DOI: 10.1002/pip.3097

24.58% total area efficiency of screen-printed, large area industrial silicon solar cells with the tunnel oxide passivated contacts (i-TOPCon) design
journal, March 2020


n-Type Si solar cells with passivating electron contact: Identifying sources for efficiency limitations by wafer thickness and resistivity variation
journal, December 2017


TOPCon – Technology options for cost efficient industrial manufacturing
journal, August 2021


Laser contact openings for local poly-Si-metal contacts enabling 26.1%-efficient POLO-IBC solar cells
journal, November 2018


26%-efficient and 2 cm narrow interdigitated back contact silicon solar cells with passivated slits on two edges
journal, September 2019


26.1%‐efficient POLO‐IBC cells: Quantification of electrical and optical loss mechanisms
journal, October 2018

  • Hollemann, Christina; Haase, Felix; Schäfer, Sören
  • Progress in Photovoltaics: Research and Applications, Vol. 27, Issue 11
  • DOI: 10.1002/pip.3098

Passivation quality control in poly-Si/SiO /c-Si passivated contact solar cells with 734 mV implied open circuit voltage
journal, January 2019


Material properties of LPCVD processed n-type polysilicon passivating contacts and its application in PERPoly industrial bifacial solar cells
journal, September 2017


Phosphorus-doped polysilicon passivating contacts deposited by atmospheric pressure chemical vapor deposition
journal, July 2021

  • Mousumi, Jannatul Ferdous; Ali, Haider; Gregory, Geoffrey
  • Journal of Physics D: Applied Physics, Vol. 54, Issue 38
  • DOI: 10.1088/1361-6463/ac0e5c

Raman spectroscopy of heavily doped polycrystalline silicon thin films
journal, June 2000


Grain Growth Mechanism of Heavily Phosphorus‐Implanted Polycrystalline Silicon
journal, September 1978

  • Wada, Yasuo; Nishimatsu, Shigeru
  • Journal of The Electrochemical Society, Vol. 125, Issue 9
  • DOI: 10.1149/1.2131703

Preparation of High-Quality n-Type Poly-Si Films by the Solid Phase Crystallization (SPC) Method
journal, November 1990

  • Matsuyama, Takao; Wakisaka, Kenichiro; Kameda, Masaaki
  • Japanese Journal of Applied Physics, Vol. 29, Issue 11R
  • DOI: 10.1143/JJAP.29.2327

A quantitative theory of grain-boundary motion and recrystallization in metals in the presence of impurities
journal, November 1957


Solid phase crystallized polycrystalline thin-films on glass from evaporated silicon for photovoltaic applications
journal, August 2006


The electrical properties of polycrystalline silicon films
journal, December 1975

  • Seto, John Y. W.
  • Journal of Applied Physics, Vol. 46, Issue 12
  • DOI: 10.1063/1.321593

In situ phosphorus-doped polycrystalline silicon films by low pressure chemical vapor deposition for contact passivation of silicon solar cells
journal, January 2022


Electron and hole mobilities in silicon as a function of concentration and temperature
journal, February 1982

  • Arora, N. D.; Hauser, J. R.; Roulston, D. J.
  • IEEE Transactions on Electron Devices, Vol. 29, Issue 2
  • DOI: 10.1109/T-ED.1982.20698

Resistivity‐Dopant Density Relationship for Phosphorus‐Doped Silicon
journal, August 1980

  • Thurber, W. R.; Mattis, R. L.; Liu, Y. M.
  • Journal of The Electrochemical Society, Vol. 127, Issue 8
  • DOI: 10.1149/1.2130006

Phosphorus segregation at polysilicon-silicon interfaces from in situ P spike-doped silicon films
journal, March 1995


Polysilicon Passivating Contacts for Silicon Solar Cells: Interface Passivation and Carrier Transport Mechanism
journal, June 2019

  • Liu, Wenzhu; Yang, Xinbo; Kang, Jingxuan
  • ACS Applied Energy Materials, Vol. 2, Issue 7
  • DOI: 10.1021/acsaem.8b02149

On the passivation mechanism of poly-silicon and thin silicon oxide on crystal silicon wafers
journal, December 2019


Improved quantitative description of Auger recombination in crystalline silicon
journal, October 2012


Polycrystalline silicon passivated tunneling contacts for high efficiency silicon solar cells
journal, March 2016

  • Nemeth, Bill; Young, David L.; Page, Matthew R.
  • Journal of Materials Research, Vol. 31, Issue 6, p. 671-681
  • DOI: 10.1557/jmr.2016.77

Working principle of carrier selective poly-Si/c-Si junctions: Is tunnelling the whole story?
journal, December 2016


Passivation properties of tunnel oxide layer in passivated contact silicon solar cells
journal, July 2017


Influence of SiOx film thickness on electrical performance and efficiency of TOPCon solar cells
journal, May 2020


Tunnel oxide passivated contacts as an alternative to partial rear contacts
journal, December 2014


On the hydrogenation of Poly-Si passivating contacts by Al2O3 and SiN thin films
journal, September 2020


Recombination and Resistive Losses of Transferred Foil Contacts for Silicon Heterojunction Solar Cells
journal, September 2020

  • Iqbal, Nafis; Li, Mengjie; Gregory, Geoffrey
  • physica status solidi (RRL) – Rapid Research Letters, Vol. 14, Issue 11
  • DOI: 10.1002/pssr.202000368

Solar cell contact resistance—A review
journal, May 1984

  • Schroder, D. K.; Meier, D. L.
  • IEEE Transactions on Electron Devices, Vol. 31, Issue 5
  • DOI: 10.1109/T-ED.1984.21583

Detailed investigation of TLM contact resistance measurements on crystalline silicon solar cells
journal, July 2017


Nondestructive Contact Resistivity Measurements on Solar Cells Using the Circular Transmission Line Method
journal, November 2019


A Comprehensive Evaluation of Contact Recombination and Contact Resistivity Losses in Industrial Silicon Solar Cells
journal, September 2020